Nano-measuring living cell surface by AFM

Takaharu Okajima, Masaru Tanaka, Katsuhiro Ishii, Hiroshi Tokumoto

Research output: Contribution to conferencePaperpeer-review


An atomic force microscope (AFM) is a powerful tool for investigating soft materials in liquid environments. We developed a newly designed AFM, which employs a fiber-optic interferometer and a low coherence laser such as a super-luminescence diode. The advantage of this AFM is that this AFM is set up on a conventional optical microscope without blocking a light path for obtaining optical images and that the AFM does not suffer from a stray light of the fiber-optics, which is usually inevitable. It was demonstrated that the AFM could measure the small deflection of the AFM cantilever. Moreover, we developed a technique that precisely measures the contact point between the soft cell surfaces and an AFM tip. The result was that the spectrum of the thermally vibrated cantilever was drastically decreased when the tip contacted the surface, indicating that the method is useful for determining the contact of the tip-soft materials such as living cells in liquids.

Original languageEnglish
Number of pages1
Publication statusPublished - Dec 1 2005
Externally publishedYes
Event54th SPSJ Annual Meeting 2005 - Yokohama, Japan
Duration: May 25 2005May 27 2005


Other54th SPSJ Annual Meeting 2005

All Science Journal Classification (ASJC) codes

  • Engineering(all)


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