TY - JOUR
T1 - Nanometer-scale depth resolution and sensitive surface analysis using laser ablation atomic fluorescence spectroscopy
AU - Nakamura, Daisuke
AU - Oki, Yuji
AU - Higotani, Takashi
AU - Takao, Takayuki
AU - Maeda, Mitsuo
PY - 2006/6/28
Y1 - 2006/6/28
N2 - An extremely high-resolution, nanometer-resolution, solid-surface trace element detection has been demonstrated. Nanometer-thinned pulsed laser ablation was combined with extremely sensitive laser-induced fluorescence spectroscopy, and depth resolution of 3.6 nm was experimentally demonstrated for the first time on sodium detection in polymeric samples. An extremely high absolute detection limit of 25.2 fg was also obtained, and a theoretical calculation program was also generated to analyze the results.
AB - An extremely high-resolution, nanometer-resolution, solid-surface trace element detection has been demonstrated. Nanometer-thinned pulsed laser ablation was combined with extremely sensitive laser-induced fluorescence spectroscopy, and depth resolution of 3.6 nm was experimentally demonstrated for the first time on sodium detection in polymeric samples. An extremely high absolute detection limit of 25.2 fg was also obtained, and a theoretical calculation program was also generated to analyze the results.
UR - http://www.scopus.com/inward/record.url?scp=33745278868&partnerID=8YFLogxK
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U2 - 10.1143/JJAP.45.5322
DO - 10.1143/JJAP.45.5322
M3 - Article
AN - SCOPUS:33745278868
SN - 0021-4922
VL - 45
SP - 5322
EP - 5325
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
IS - 6 A
ER -