Nanometer-scale depth resolution and sensitive surface analysis using laser ablation atomic fluorescence spectroscopy

Daisuke Nakamura, Yuji Oki, Takashi Higotani, Takayuki Takao, Mitsuo Maeda

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

An extremely high-resolution, nanometer-resolution, solid-surface trace element detection has been demonstrated. Nanometer-thinned pulsed laser ablation was combined with extremely sensitive laser-induced fluorescence spectroscopy, and depth resolution of 3.6 nm was experimentally demonstrated for the first time on sodium detection in polymeric samples. An extremely high absolute detection limit of 25.2 fg was also obtained, and a theoretical calculation program was also generated to analyze the results.

Original languageEnglish
Pages (from-to)5322-5325
Number of pages4
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume45
Issue number6 A
DOIs
Publication statusPublished - Jun 28 2006

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

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