A solid-state surface analysis of trace element was demonstrated with nanometer depth resolution and femtogram detection sensitivity. An LIF spectroscopy was combined with an excimer laser ablation, and the depth resolution of 3.6nm was obtained.
|Number of pages||2|
|Journal||OSA Trends in Optics and Photonics Series|
|Publication status||Published - Jan 1 2003|
|Event||Conference on Lasers and Electro-Optics (CLEO); Postconference Digest - Baltimore, MD, United States|
Duration: Jun 1 2003 → Jun 6 2003
All Science Journal Classification (ASJC) codes