Nanoscale microstructural analyses by atom probe field ion microscopy

K. Hono, M. Murayama

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

Recent progress in atom probe field ion microscopy (APFIM) and its applications to nanoscate microstructural studies of metallic materials are reviewed. By employing a three dimensional atom probe (3DAP), it is possible to map out elemental distributions in the real space with almost an atomic resolution, and chemical analysis of interfaces and nanoparticles can be made with improved accuracy in comparison with the conventional atom probe. Unique features of atom probe field ion microscopy are demonstrated by showing recent examples of APFIM and 3DAP applications to nanoscalc characterizations of aluminum alloys, nanocrystalline magnetic materials and steels.

Original languageEnglish
Pages (from-to)69-85
Number of pages17
JournalHigh Temperature Materials and Processes
Volume17
Issue number1
DOIs
Publication statusPublished - Jan 1 1998
Externally publishedYes

Fingerprint

Microscopic examination
Ions
microscopy
Atoms
probes
atoms
ions
Nanocrystalline materials
Steel
Magnetic materials
magnetic materials
chemical analysis
aluminum alloys
Aluminum alloys
steels
Nanoparticles
nanoparticles
Chemical analysis

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Physical and Theoretical Chemistry

Cite this

Nanoscale microstructural analyses by atom probe field ion microscopy. / Hono, K.; Murayama, M.

In: High Temperature Materials and Processes, Vol. 17, No. 1, 01.01.1998, p. 69-85.

Research output: Contribution to journalArticle

@article{3bf43f8abe4a415eae8c1806415552ed,
title = "Nanoscale microstructural analyses by atom probe field ion microscopy",
abstract = "Recent progress in atom probe field ion microscopy (APFIM) and its applications to nanoscate microstructural studies of metallic materials are reviewed. By employing a three dimensional atom probe (3DAP), it is possible to map out elemental distributions in the real space with almost an atomic resolution, and chemical analysis of interfaces and nanoparticles can be made with improved accuracy in comparison with the conventional atom probe. Unique features of atom probe field ion microscopy are demonstrated by showing recent examples of APFIM and 3DAP applications to nanoscalc characterizations of aluminum alloys, nanocrystalline magnetic materials and steels.",
author = "K. Hono and M. Murayama",
year = "1998",
month = "1",
day = "1",
doi = "10.1515/HTMP.1998.17.1-2.69",
language = "English",
volume = "17",
pages = "69--85",
journal = "High Temperature Materials and Processes",
issn = "0334-6455",
publisher = "Walter de Gruyter GmbH",
number = "1",

}

TY - JOUR

T1 - Nanoscale microstructural analyses by atom probe field ion microscopy

AU - Hono, K.

AU - Murayama, M.

PY - 1998/1/1

Y1 - 1998/1/1

N2 - Recent progress in atom probe field ion microscopy (APFIM) and its applications to nanoscate microstructural studies of metallic materials are reviewed. By employing a three dimensional atom probe (3DAP), it is possible to map out elemental distributions in the real space with almost an atomic resolution, and chemical analysis of interfaces and nanoparticles can be made with improved accuracy in comparison with the conventional atom probe. Unique features of atom probe field ion microscopy are demonstrated by showing recent examples of APFIM and 3DAP applications to nanoscalc characterizations of aluminum alloys, nanocrystalline magnetic materials and steels.

AB - Recent progress in atom probe field ion microscopy (APFIM) and its applications to nanoscate microstructural studies of metallic materials are reviewed. By employing a three dimensional atom probe (3DAP), it is possible to map out elemental distributions in the real space with almost an atomic resolution, and chemical analysis of interfaces and nanoparticles can be made with improved accuracy in comparison with the conventional atom probe. Unique features of atom probe field ion microscopy are demonstrated by showing recent examples of APFIM and 3DAP applications to nanoscalc characterizations of aluminum alloys, nanocrystalline magnetic materials and steels.

UR - http://www.scopus.com/inward/record.url?scp=0031649242&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0031649242&partnerID=8YFLogxK

U2 - 10.1515/HTMP.1998.17.1-2.69

DO - 10.1515/HTMP.1998.17.1-2.69

M3 - Article

AN - SCOPUS:0031649242

VL - 17

SP - 69

EP - 85

JO - High Temperature Materials and Processes

JF - High Temperature Materials and Processes

SN - 0334-6455

IS - 1

ER -