Nanoscale microstructural analyses by atom probe field ion microscopy

K. Hono, M. Murayama

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)

Abstract

Recent progress in atom probe field ion microscopy (APFIM) and its applications to nanoscate microstructural studies of metallic materials are reviewed. By employing a three dimensional atom probe (3DAP), it is possible to map out elemental distributions in the real space with almost an atomic resolution, and chemical analysis of interfaces and nanoparticles can be made with improved accuracy in comparison with the conventional atom probe. Unique features of atom probe field ion microscopy are demonstrated by showing recent examples of APFIM and 3DAP applications to nanoscalc characterizations of aluminum alloys, nanocrystalline magnetic materials and steels.

Original languageEnglish
Pages (from-to)69-85
Number of pages17
JournalHigh Temperature Materials and Processes
Volume17
Issue number1
DOIs
Publication statusPublished - 1998
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Physical and Theoretical Chemistry

Fingerprint Dive into the research topics of 'Nanoscale microstructural analyses by atom probe field ion microscopy'. Together they form a unique fingerprint.

Cite this