Near-edge X-ray absorption fine-structure spectroscopic study on nitrogen-doped ultrananocrystalline diamond/hydrogenated amorphous carbon composite films prepared by pulsed laser deposition

Sausan Al-Riyami, Shinya Ohmagari, Tsuyoshi Yoshitake

    Research output: Contribution to journalArticle

    7 Citations (Scopus)

    Abstract

    Nitrogen-doped ultrananocrystalline diamond (UNCD)/hydrogenated amorphous carbon (a-C:H) composite films, which possessed n-type conduction with enhanced electrical conductivity, were prepared by pulsed laser deposition. The film doped with a nitrogen content of 7.9 at. % possessed enhanced electrical conductivity of 18Ω-1·cm-1 at 300 K. The near-edge X-ray absorption fine-structure (NEXAFS) measurement indicated the appearance of additional peaks due to π* C=N, σ* C=N, and σ*C-N bonds compared with the spectra of undoped films. The sp2 bonding fraction estimated from the NEXAFS spectra increased with the nitrogen content. The enhanced electrical conductivity is probably due to the formation of additional π* and σ* states and the enhancement in the sp2 bonding fraction.

    Original languageEnglish
    Article number08JD05
    JournalJapanese journal of applied physics
    Volume50
    Issue number8 PART 2
    DOIs
    Publication statusPublished - Aug 1 2011

    All Science Journal Classification (ASJC) codes

    • Engineering(all)
    • Physics and Astronomy(all)

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