Near-field scanning optical microscopy of photonic crystal high-Q nanocavities

Koichi Okamoto, Marko Lončar, Tomoyuki Yoshie, Axel Scherer, Yueming Qiu, Pawan Gogna

Research output: Contribution to conferencePaper

Abstract

Near-field scanning optical microscopy (NSOM) was used to observe high-resolution images of planar photonic crystal nanocavities fabricated in active InGaAsP material. We have observed the smallest optical cavity modes and dielectric band modes.

Original languageEnglish
PagesQFA2/1-QFA2/2
Publication statusPublished - Dec 1 2003
EventTrends in Optics and Photonics Series: Quantum electronics and Laser Science (QELS) - Baltimore, MD., United States
Duration: Jun 1 2003Jun 6 2003

Other

OtherTrends in Optics and Photonics Series: Quantum electronics and Laser Science (QELS)
CountryUnited States
CityBaltimore, MD.
Period6/1/036/6/03

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All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

Okamoto, K., Lončar, M., Yoshie, T., Scherer, A., Qiu, Y., & Gogna, P. (2003). Near-field scanning optical microscopy of photonic crystal high-Q nanocavities. QFA2/1-QFA2/2. Paper presented at Trends in Optics and Photonics Series: Quantum electronics and Laser Science (QELS), Baltimore, MD., United States.