Negative and Positive Muon-Induced Single Event Upsets in 65-nm UTBB SOI SRAMs

Seiya Manabe, Yukinobu Watanabe, Wang Liao, Masanori Hashimoto, Keita Nakano, Hikaru Sato, Tadahiro Kin, Shin Ichiro Abe, Koji Hamada, Motonobu Tampo, Yasuhiro Miyake

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9 Citations (Scopus)

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Engineering & Materials Science

Physics & Astronomy