Neutron-induced soft error rate estimation for SRAM using PHITS

Shusuke Yoshimoto, Takuro Amashita, Masayoshi Yoshimura, Yusuke Matsunaga, Hiroto Yasuura, Shintaro Izumi, Hiroshi Kawaguchi, Masahiko Yoshimoto

Research output: Chapter in Book/Report/Conference proceedingConference contribution

6 Citations (Scopus)

Abstract

This paper presents a novel neutron-induced soft-error-rate (SER) estimation tool with a particle transport code: PHITS. The proposed tool can calculate the SER according to various data patterns and the layout of the memory cells in an SRAM. As layouts, two kinds of an NMOS-PMOS-NMOS 6T and an inside-out PMOS-NMOS-PMOS versions are considered. The proposed tool distinguishes a single-event-upset (SEU) SER, a horizontal multiple-cell-upset (MCU) SER, and a vertical MCU SER using an extracting function. The horizontal MCU SER in the inside-out version of the PMOS-NMOS-PMOS 6T SRAM cell layout was expected to be 26-41% less than that of the general NMOS-PMOS-NMOS 6T cell layout.

Original languageEnglish
Title of host publicationProceedings of the 2012 IEEE 18th International On-Line Testing Symposium, IOLTS 2012
Pages138-141
Number of pages4
DOIs
Publication statusPublished - Nov 22 2012
Event2012 IEEE 18th International On-Line Testing Symposium, IOLTS 2012 - Sitges, Spain
Duration: Jun 27 2012Jun 29 2012

Publication series

NameProceedings of the 2012 IEEE 18th International On-Line Testing Symposium, IOLTS 2012

Other

Other2012 IEEE 18th International On-Line Testing Symposium, IOLTS 2012
CountrySpain
CitySitges
Period6/27/126/29/12

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All Science Journal Classification (ASJC) codes

  • Safety, Risk, Reliability and Quality

Cite this

Yoshimoto, S., Amashita, T., Yoshimura, M., Matsunaga, Y., Yasuura, H., Izumi, S., ... Yoshimoto, M. (2012). Neutron-induced soft error rate estimation for SRAM using PHITS. In Proceedings of the 2012 IEEE 18th International On-Line Testing Symposium, IOLTS 2012 (pp. 138-141). [6313859] (Proceedings of the 2012 IEEE 18th International On-Line Testing Symposium, IOLTS 2012). https://doi.org/10.1109/IOLTS.2012.6313859