We propose a new beam scanning model that is applicable to electrooptic materials with electron traps. With this model, we can achieve both high-speed operation and wide-angle scanning, because the operating speed is limited not by the electron mobility but by the frequency limit of the electrooptic effect of the materials. The voltage dependence of the scanning angle at 100 kHz using a KTa1-xNbxO3 crystal is consistent with the property predicted by the proposed model.
All Science Journal Classification (ASJC) codes
- Physics and Astronomy(all)