Abstract
45° grain boundaries, which drastically increase surface resistance (RS) in superconducting YBa2Cu3O7-δ films for microwave devices on MgO substrates, are eliminated using a new buffer layer of BaSnO3. BaSnO3 buffer layers and YBa2Cu3O7-δ films are grown by ArF pulsed laser deposition. Epitaxial relationships among BaSnO3, YBa2Cu3O7-δ and MgO are confirmed by x-ray φ-scanning. The RS values of the YBa2Cu3O7-δ films are measured using a dielectric resonator with 22 GHz TE011 mode. The epitaxial YBa2Cu3O7-δ films grown on BaSnO3 buffered MgO substrates show lower RS than YBa2Cu3O7-δ films directly grown on MgO substrates. The BaSnO3 buffer layer which enables YBa2Cu3O7-δ films to grow without 45° grain boundaries at a optimum film growth condition is attractive for microwave applications.
Original language | English |
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Pages (from-to) | 890-892 |
Number of pages | 3 |
Journal | Superconductor Science and Technology |
Volume | 12 |
Issue number | 11 |
DOIs | |
Publication status | Published - Nov 1 1999 |
Externally published | Yes |
Event | Proceedings of the 1999 International Superconductive Electronics Conference - Berkeley, CA, USA Duration: Jun 21 1999 → Jun 25 1999 |
All Science Journal Classification (ASJC) codes
- Ceramics and Composites
- Condensed Matter Physics
- Metals and Alloys
- Electrical and Electronic Engineering
- Materials Chemistry