TY - JOUR
T1 - Non-destructive analyses of operational degradation of OLED devices
AU - Miyamae, Takayuki
AU - Takada, Noriyuki
AU - Yoshioka, Toshihiro
AU - Miyaguci, Satoshi
AU - Ohata, Hiroshi
AU - Okumoto, Hajime
AU - Yahiro, Masayuki
AU - Tsutsui, Yuko
AU - Adachi, Chihaya
AU - Tsutsu, Tetsuo
N1 - Publisher Copyright:
© 2015 SID.
PY - 2015/6/1
Y1 - 2015/6/1
N2 - Non-destructive analyses are conducted on the intrinsic degradation of organic light-emitting diodes (OLEDs). After long- Term operation, sum-frequency spectroscopy reveals changes in the molecular orientation. Furthermore, change in the mobility of the OLEDs can be evaluated from impedance spectroscopy. Carrier trap behavior is also investigated via thermally stimulated current spectroscopy.
AB - Non-destructive analyses are conducted on the intrinsic degradation of organic light-emitting diodes (OLEDs). After long- Term operation, sum-frequency spectroscopy reveals changes in the molecular orientation. Furthermore, change in the mobility of the OLEDs can be evaluated from impedance spectroscopy. Carrier trap behavior is also investigated via thermally stimulated current spectroscopy.
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U2 - 10.1002/sdtp.10226
DO - 10.1002/sdtp.10226
M3 - Conference article
AN - SCOPUS:84962796439
SN - 0097-966X
VL - 46
SP - 782
EP - 785
JO - Digest of Technical Papers - SID International Symposium
JF - Digest of Technical Papers - SID International Symposium
IS - Book 2
T2 - 2015 SID International Symposium
Y2 - 4 June 2015 through 5 June 2015
ER -