Non-destructive analyses of operational degradation of OLED devices

Takayuki Miyamae, Noriyuki Takada, Toshihiro Yoshioka, Satoshi Miyaguci, Hiroshi Ohata, Hajime Okumoto, Masayuki Yahiro, Yuko Tsutsui, Chihaya Adachi, Tetsuo Tsutsu

Research output: Contribution to journalConference article

Abstract

Non-destructive analyses are conducted on the intrinsic degradation of organic light-emitting diodes (OLEDs). After long- Term operation, sum-frequency spectroscopy reveals changes in the molecular orientation. Furthermore, change in the mobility of the OLEDs can be evaluated from impedance spectroscopy. Carrier trap behavior is also investigated via thermally stimulated current spectroscopy.

Original languageEnglish
Pages (from-to)782-785
Number of pages4
JournalDigest of Technical Papers - SID International Symposium
Volume46
Issue numberBook 2
DOIs
Publication statusPublished - Jun 1 2015
Event2015 SID International Symposium - San Jose, United States
Duration: Jun 4 2015Jun 5 2015

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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  • Cite this

    Miyamae, T., Takada, N., Yoshioka, T., Miyaguci, S., Ohata, H., Okumoto, H., Yahiro, M., Tsutsui, Y., Adachi, C., & Tsutsu, T. (2015). Non-destructive analyses of operational degradation of OLED devices. Digest of Technical Papers - SID International Symposium, 46(Book 2), 782-785. https://doi.org/10.1002/sdtp.10226