Non-destructive analyses are conducted on the intrinsic degradation of organic light-emitting diodes (OLEDs). After long- Term operation, sum-frequency spectroscopy reveals changes in the molecular orientation. Furthermore, change in the mobility of the OLEDs can be evaluated from impedance spectroscopy. Carrier trap behavior is also investigated via thermally stimulated current spectroscopy.
|Number of pages||4|
|Journal||Digest of Technical Papers - SID International Symposium|
|Issue number||Book 2|
|Publication status||Published - Jun 1 2015|
|Event||2015 SID International Symposium - San Jose, United States|
Duration: Jun 4 2015 → Jun 5 2015
All Science Journal Classification (ASJC) codes