Non-destructive analyses of operational degradation of OLED devices

Takayuki Miyamae, Noriyuki Takada, Toshihiro Yoshioka, Satoshi Miyaguci, Hiroshi Ohata, Hajime Okumoto, Masayuki Yahiro, Yuko Tsutsui, Chihaya Adachi, Tetsuo Tsutsu

Research output: Contribution to journalConference article

Abstract

Non-destructive analyses are conducted on the intrinsic degradation of organic light-emitting diodes (OLEDs). After long- Term operation, sum-frequency spectroscopy reveals changes in the molecular orientation. Furthermore, change in the mobility of the OLEDs can be evaluated from impedance spectroscopy. Carrier trap behavior is also investigated via thermally stimulated current spectroscopy.

Original languageEnglish
Pages (from-to)782-785
Number of pages4
JournalDigest of Technical Papers - SID International Symposium
Volume46
Issue numberBook 2
Publication statusPublished - Jun 1 2015
Event2015 SID International Symposium - San Jose, United States
Duration: Jun 4 2015Jun 5 2015

Fingerprint

Organic light emitting diodes (OLED)
Spectroscopy
Degradation
Molecular orientation

All Science Journal Classification (ASJC) codes

  • Engineering(all)

Cite this

Miyamae, T., Takada, N., Yoshioka, T., Miyaguci, S., Ohata, H., Okumoto, H., ... Tsutsu, T. (2015). Non-destructive analyses of operational degradation of OLED devices. Digest of Technical Papers - SID International Symposium, 46(Book 2), 782-785.

Non-destructive analyses of operational degradation of OLED devices. / Miyamae, Takayuki; Takada, Noriyuki; Yoshioka, Toshihiro; Miyaguci, Satoshi; Ohata, Hiroshi; Okumoto, Hajime; Yahiro, Masayuki; Tsutsui, Yuko; Adachi, Chihaya; Tsutsu, Tetsuo.

In: Digest of Technical Papers - SID International Symposium, Vol. 46, No. Book 2, 01.06.2015, p. 782-785.

Research output: Contribution to journalConference article

Miyamae, T, Takada, N, Yoshioka, T, Miyaguci, S, Ohata, H, Okumoto, H, Yahiro, M, Tsutsui, Y, Adachi, C & Tsutsu, T 2015, 'Non-destructive analyses of operational degradation of OLED devices', Digest of Technical Papers - SID International Symposium, vol. 46, no. Book 2, pp. 782-785.
Miyamae T, Takada N, Yoshioka T, Miyaguci S, Ohata H, Okumoto H et al. Non-destructive analyses of operational degradation of OLED devices. Digest of Technical Papers - SID International Symposium. 2015 Jun 1;46(Book 2):782-785.
Miyamae, Takayuki ; Takada, Noriyuki ; Yoshioka, Toshihiro ; Miyaguci, Satoshi ; Ohata, Hiroshi ; Okumoto, Hajime ; Yahiro, Masayuki ; Tsutsui, Yuko ; Adachi, Chihaya ; Tsutsu, Tetsuo. / Non-destructive analyses of operational degradation of OLED devices. In: Digest of Technical Papers - SID International Symposium. 2015 ; Vol. 46, No. Book 2. pp. 782-785.
@article{f47f4b5ba48e4240ae39a58f76ac83bb,
title = "Non-destructive analyses of operational degradation of OLED devices",
abstract = "Non-destructive analyses are conducted on the intrinsic degradation of organic light-emitting diodes (OLEDs). After long- Term operation, sum-frequency spectroscopy reveals changes in the molecular orientation. Furthermore, change in the mobility of the OLEDs can be evaluated from impedance spectroscopy. Carrier trap behavior is also investigated via thermally stimulated current spectroscopy.",
author = "Takayuki Miyamae and Noriyuki Takada and Toshihiro Yoshioka and Satoshi Miyaguci and Hiroshi Ohata and Hajime Okumoto and Masayuki Yahiro and Yuko Tsutsui and Chihaya Adachi and Tetsuo Tsutsu",
year = "2015",
month = "6",
day = "1",
language = "English",
volume = "46",
pages = "782--785",
journal = "Digest of Technical Papers - SID International Symposium",
issn = "0097-966X",
number = "Book 2",

}

TY - JOUR

T1 - Non-destructive analyses of operational degradation of OLED devices

AU - Miyamae, Takayuki

AU - Takada, Noriyuki

AU - Yoshioka, Toshihiro

AU - Miyaguci, Satoshi

AU - Ohata, Hiroshi

AU - Okumoto, Hajime

AU - Yahiro, Masayuki

AU - Tsutsui, Yuko

AU - Adachi, Chihaya

AU - Tsutsu, Tetsuo

PY - 2015/6/1

Y1 - 2015/6/1

N2 - Non-destructive analyses are conducted on the intrinsic degradation of organic light-emitting diodes (OLEDs). After long- Term operation, sum-frequency spectroscopy reveals changes in the molecular orientation. Furthermore, change in the mobility of the OLEDs can be evaluated from impedance spectroscopy. Carrier trap behavior is also investigated via thermally stimulated current spectroscopy.

AB - Non-destructive analyses are conducted on the intrinsic degradation of organic light-emitting diodes (OLEDs). After long- Term operation, sum-frequency spectroscopy reveals changes in the molecular orientation. Furthermore, change in the mobility of the OLEDs can be evaluated from impedance spectroscopy. Carrier trap behavior is also investigated via thermally stimulated current spectroscopy.

UR - http://www.scopus.com/inward/record.url?scp=84962796439&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84962796439&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:84962796439

VL - 46

SP - 782

EP - 785

JO - Digest of Technical Papers - SID International Symposium

JF - Digest of Technical Papers - SID International Symposium

SN - 0097-966X

IS - Book 2

ER -