Non-destructive measurement of sugar content in apples using millimeter wave reflectometry and artificial neural networks for calibration

Makoto Oda, Atsushi Mase, Kiichiro Uchino

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Citations (Scopus)

Abstract

A millimeter wave reflectometer has been developed for non-destructive measurement of sugar content in fruits. The intensity of reflected wave varies not only by sugar content but also by temperature of fruits. Therefore, a calibration curve to calculate sugar content by binary measurements is necessary. We report here a method for making a calibration curve by using a feed forward artificial neural network(ANN). An ANN containing three layers of nodes was trained. Sigmoidal and linear transfer functions were used in the hidden and output layers, respectively. The proposed method was applied satisfactorily to measure sugar content in apples.

Original languageEnglish
Title of host publicationAsia-Pacific Microwave Conference Proceedings, APMC 2011
Pages1386-1389
Number of pages4
Publication statusPublished - 2011
EventAsia-Pacific Microwave Conference, APMC 2011 - Melbourne, VIC, Australia
Duration: Dec 5 2011Dec 8 2011

Other

OtherAsia-Pacific Microwave Conference, APMC 2011
CountryAustralia
CityMelbourne, VIC
Period12/5/1112/8/11

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering

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    Oda, M., Mase, A., & Uchino, K. (2011). Non-destructive measurement of sugar content in apples using millimeter wave reflectometry and artificial neural networks for calibration. In Asia-Pacific Microwave Conference Proceedings, APMC 2011 (pp. 1386-1389). [6174019]