A new method to investigate the influence of vacuum chamber impurities on OLED lifetime is demonstrated. By combining deposition from a novel-design crucible with in-situ exposure to impurity sources, and by controlling the amount of water impinging, we show that the influence of water and impurities can be separately examined.
|Number of pages||4|
|Journal||Digest of Technical Papers - SID International Symposium|
|Publication status||Published - 2020|
|Event||57th SID International Symposium, Seminar and Exhibition, Display Week, 2020 - Virtual, Online|
Duration: Aug 3 2020 → Aug 7 2020
All Science Journal Classification (ASJC) codes