Novel methodology for reproducibility of OLED lifetimes and identification of killer impurities

Hiroshi Fujimoto, Toshimitsu Nakamum, Kaori Nagayoshi, Kentaro Harada, Hiroshi Miyazaki, Takaomi Kurata, Junya Kiyota, Chihaya Adachi

Research output: Contribution to journalConference articlepeer-review

Abstract

A new method to investigate the influence of vacuum chamber impurities on OLED lifetime is demonstrated. By combining deposition from a novel-design crucible with in-situ exposure to impurity sources, and by controlling the amount of water impinging, we show that the influence of water and impurities can be separately examined.

Original languageEnglish
Pages (from-to)822-825
Number of pages4
JournalDigest of Technical Papers - SID International Symposium
Volume51
Issue number1
DOIs
Publication statusPublished - 2020
Event57th SID International Symposium, Seminar and Exhibition, Display Week, 2020 - Virtual, Online
Duration: Aug 3 2020Aug 7 2020

All Science Journal Classification (ASJC) codes

  • Engineering(all)

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