### Abstract

By the development of micro fabrication technology, further smaller-size electronic devices will be available. In such a smaller device, non equilibrium state might be appeared for careers in metal and/or semiconductor that constitute the device. In such a situation the device performance estimation by the macroscopic transport equations that assume quasi-equilibrium distribution is difficult. Against the background of this difficulty. we are developing a numerical simulation based on Boltzmann transport equation (BTE), which can analyze thermal and electric phenomena even when the state is far from equilibrium. In this paper, we numerically analyzed heat flux and thermoelectric voltage for simple one dimensional system by solving BTE with discretization of all wave number spaces. The calculation result of heat flux agreed with the value estimated from Fourier's law.

Original language | English |
---|---|

Pages (from-to) | 140-145 |

Number of pages | 6 |

Journal | Nihon Kikai Gakkai Ronbunshu, B Hen/Transactions of the Japan Society of Mechanical Engineers, Part B |

Volume | 75 |

Issue number | 1 |

Publication status | Published - Jan 2009 |

### Fingerprint

### All Science Journal Classification (ASJC) codes

- Mechanical Engineering
- Condensed Matter Physics

### Cite this

**Numerical analysis of thermoelectric phenomenon by boltzmann transport equation with discretization of all wave-number spaces.** / Ito, Kohei; Muramoto, Ryohei; Miki, Takafumi.

Research output: Contribution to journal › Article

*Nihon Kikai Gakkai Ronbunshu, B Hen/Transactions of the Japan Society of Mechanical Engineers, Part B*, vol. 75, no. 1, pp. 140-145.

}

TY - JOUR

T1 - Numerical analysis of thermoelectric phenomenon by boltzmann transport equation with discretization of all wave-number spaces

AU - Ito, Kohei

AU - Muramoto, Ryohei

AU - Miki, Takafumi

PY - 2009/1

Y1 - 2009/1

N2 - By the development of micro fabrication technology, further smaller-size electronic devices will be available. In such a smaller device, non equilibrium state might be appeared for careers in metal and/or semiconductor that constitute the device. In such a situation the device performance estimation by the macroscopic transport equations that assume quasi-equilibrium distribution is difficult. Against the background of this difficulty. we are developing a numerical simulation based on Boltzmann transport equation (BTE), which can analyze thermal and electric phenomena even when the state is far from equilibrium. In this paper, we numerically analyzed heat flux and thermoelectric voltage for simple one dimensional system by solving BTE with discretization of all wave number spaces. The calculation result of heat flux agreed with the value estimated from Fourier's law.

AB - By the development of micro fabrication technology, further smaller-size electronic devices will be available. In such a smaller device, non equilibrium state might be appeared for careers in metal and/or semiconductor that constitute the device. In such a situation the device performance estimation by the macroscopic transport equations that assume quasi-equilibrium distribution is difficult. Against the background of this difficulty. we are developing a numerical simulation based on Boltzmann transport equation (BTE), which can analyze thermal and electric phenomena even when the state is far from equilibrium. In this paper, we numerically analyzed heat flux and thermoelectric voltage for simple one dimensional system by solving BTE with discretization of all wave number spaces. The calculation result of heat flux agreed with the value estimated from Fourier's law.

UR - http://www.scopus.com/inward/record.url?scp=63849185935&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=63849185935&partnerID=8YFLogxK

M3 - Article

VL - 75

SP - 140

EP - 145

JO - Nihon Kikai Gakkai Ronbunshu, B Hen/Transactions of the Japan Society of Mechanical Engineers, Part B

JF - Nihon Kikai Gakkai Ronbunshu, B Hen/Transactions of the Japan Society of Mechanical Engineers, Part B

SN - 0387-5016

IS - 1

ER -