Numerical Electromagnetic Analysis of Lightning-Induced Voltage over Ground of Finite Conductivity

Ramesh Pokharel, Masaru Ishii, Yoshihiro Baba

Research output: Contribution to journalArticle

56 Citations (Scopus)

Abstract

Numerical Electromagnetics Code (NEC-2), which is a computer code to analyze the three-dimensional electromagnetic (EM) field around thin wires in the frequency domain, has been successfully used in lightning-related studies such as lightning surge analyses or lightning EM pulse calculations over a perfectly conducting ground. NEC-2 is still more useful in investigating lightning-induced effects over ground of finite conductivity. This application of NEC-2 is investigated by comparing calculated results with an experiment over lossy ground. The advantages of the analysis using NEC-2 are that it can accurately compute the current distribution along a wire structure with small amount of postulation. It automatically incorporates coupling between a lightning channel and transmission lines, and it can also take account of finitely conducting ground in transient condition. In addition, it can also model conductors in any arbitrary angles, and it is available in the public domain.

Original languageEnglish
Pages (from-to)651-656
Number of pages6
JournalIEEE Transactions on Electromagnetic Compatibility
Volume45
Issue number4
DOIs
Publication statusPublished - Nov 1 2003
Externally publishedYes

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lightning
Lightning
electromagnetism
conductivity
Electric potential
electric potential
wire
Wire
conduction
Electromagnetic pulse
electromagnetic pulses
current distribution
Electromagnetic fields
transmission lines
Electric lines
electromagnetic fields
conductors
computer programs
Experiments

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

Cite this

Numerical Electromagnetic Analysis of Lightning-Induced Voltage over Ground of Finite Conductivity. / Pokharel, Ramesh; Ishii, Masaru; Baba, Yoshihiro.

In: IEEE Transactions on Electromagnetic Compatibility, Vol. 45, No. 4, 01.11.2003, p. 651-656.

Research output: Contribution to journalArticle

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