The surface dynamics of polyhedral oligomeric silsesquioxane (POSS)-functionalized polystyrene (PS-POSS) thin films above the glass transition temperature were studied by grazing-incidence X-ray photon correlation spectroscopy in order to elucidate the effects of POSS at the end of the polystyrene chains. Much slower fluctuations were observed in the surface of PS-POSS thin films than in the polystyrene thin films, despite the negligible difference in their bulk viscosity. Quantitative analysis based on fluctuation-dissipation theorem indicated that there is a high-viscosity layer at the surface of the PS-POSS films, and that the substrate interface originated from POSS segregation.
|Number of pages||13|
|Publication status||Published - Nov 22 2016|
All Science Journal Classification (ASJC) codes
- Organic Chemistry
- Polymers and Plastics
- Materials Chemistry