Observation of HOPG by STM and contact AFM in various gas atmospheres under pressures up to 1.1 MPa

Yasumasa Suzuki, Hirotoshi Enoki, Etsuo Akiba

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

Apparatus comprising a scanning tunneling microscopy (STM) and an atomic force microscopy (AFM) has been developed for use under supra-atmospheres. Observations of highly oriented pyrolytic graphite (HOPG) were carried out by STM and contact AFM operating in air and various gas atmospheres (hydrogen, helium, neon and argon) under pressures up to 1.1 MPa. Atomic resolution images of the HOPG were obtained by STM in all the gas atmospheres studied. However, it was found that the presence of water vapor gave rise to a noise current at increased pressures. Using contact AFM, the atomic resolution in an argon atmosphere decreased with increasing pressure, while atomic images were obtained under the other gas atmospheres at 1.1 MPa.

Original languageEnglish
Pages (from-to)226-232
Number of pages7
JournalUltramicroscopy
Volume104
Issue number3-4
DOIs
Publication statusPublished - Oct 1 2005

Fingerprint

Graphite
pyrolytic graphite
Scanning tunneling microscopy
Contacts (fluid mechanics)
scanning tunneling microscopy
Atomic force microscopy
Argon
Gases
atomic force microscopy
atmospheres
gases
helium hydrogen atmospheres
Neon
Helium
Steam
argon
Image resolution
Water vapor
Hydrogen
image resolution

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Instrumentation

Cite this

Observation of HOPG by STM and contact AFM in various gas atmospheres under pressures up to 1.1 MPa. / Suzuki, Yasumasa; Enoki, Hirotoshi; Akiba, Etsuo.

In: Ultramicroscopy, Vol. 104, No. 3-4, 01.10.2005, p. 226-232.

Research output: Contribution to journalArticle

Suzuki, Yasumasa ; Enoki, Hirotoshi ; Akiba, Etsuo. / Observation of HOPG by STM and contact AFM in various gas atmospheres under pressures up to 1.1 MPa. In: Ultramicroscopy. 2005 ; Vol. 104, No. 3-4. pp. 226-232.
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