TY - JOUR
T1 - Observation of longitudinal spin seebeck voltage in YIG films chemically prepared by co-precipitation and spin coating
AU - Yamada, Keisuke
AU - Kurokawa, Yuichiro
AU - Kogiso, Kazuma
AU - Yuasa, Hiromi
AU - Shima, Mutsuhiro
N1 - Funding Information:
ACKNOWLEDGMENT This work was supported in part by a JSPS Grant-in-Aid for Young Scientists (A) under Grant 17H04795 and in part by the Kyushu University Platform of Inter/Transdisciplinary Energy Research. The authors would like to thank the X-ray photoelectron spectroscopy measurements and analysis to K. Hayashi, Ph.D. Student, Gifu University, Gifu, Japan.
Publisher Copyright:
© 1965-2012 IEEE.
PY - 2019/2
Y1 - 2019/2
N2 - Longitudinal spin Seebeck effect (LSSE) of Y3Fe5O12 (YIG) thin films chemically prepared on a Si substrate with a SiO2 surface layer has been investigated with a particular focus on its dependence on the metal (Pt or W) for the capping layer used to carry out the measurements. The YIG films are prepared by a combination of co-precipitation, spin coating, and annealing processes. The structural characterization by X-ray diffraction proves that the films are polycrystalline in a garnet phase with an average crystallite size of 34 nm. The microstructural analyses of the film surface by scanning electron microscopy and scanning probe microscopy show that the roughness Ra of the film is 31 nm. The magnetic easy axis of the YIG films is in the direction parallel to the films. We have found that the polarity of the LSSE voltage VLSSE measured with a Pt capping layer apparently differs from that observed when a W capping layer is used. The value of VLSSE increases almost linearly with increasing temperature difference Δ T independent of the choice of metal for the capping layer. The observed LSSE for the polycrystalline YIG films is one order of magnitude smaller than that reported for YIG and Bi:YIG single-crystal samples grown by metal-organic decomposition.
AB - Longitudinal spin Seebeck effect (LSSE) of Y3Fe5O12 (YIG) thin films chemically prepared on a Si substrate with a SiO2 surface layer has been investigated with a particular focus on its dependence on the metal (Pt or W) for the capping layer used to carry out the measurements. The YIG films are prepared by a combination of co-precipitation, spin coating, and annealing processes. The structural characterization by X-ray diffraction proves that the films are polycrystalline in a garnet phase with an average crystallite size of 34 nm. The microstructural analyses of the film surface by scanning electron microscopy and scanning probe microscopy show that the roughness Ra of the film is 31 nm. The magnetic easy axis of the YIG films is in the direction parallel to the films. We have found that the polarity of the LSSE voltage VLSSE measured with a Pt capping layer apparently differs from that observed when a W capping layer is used. The value of VLSSE increases almost linearly with increasing temperature difference Δ T independent of the choice of metal for the capping layer. The observed LSSE for the polycrystalline YIG films is one order of magnitude smaller than that reported for YIG and Bi:YIG single-crystal samples grown by metal-organic decomposition.
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U2 - 10.1109/TMAG.2018.2865199
DO - 10.1109/TMAG.2018.2865199
M3 - Article
AN - SCOPUS:85053314210
VL - 55
JO - IEEE Transactions on Magnetics
JF - IEEE Transactions on Magnetics
SN - 0018-9464
IS - 2
M1 - 8463515
ER -