Observation of longitudinal spin seebeck voltage in YIG films chemically prepared by co-precipitation and spin coating

Keisuke Yamada, Yuichiro Kurokawa, Kazuma Kogiso, Hiromi Yuasa, Mutsuhiro Shima

Research output: Contribution to journalArticle

Abstract

Longitudinal spin Seebeck effect (LSSE) of Y3Fe5O12 (YIG) thin films chemically prepared on a Si substrate with a SiO2 surface layer has been investigated with a particular focus on its dependence on the metal (Pt or W) for the capping layer used to carry out the measurements. The YIG films are prepared by a combination of co-precipitation, spin coating, and annealing processes. The structural characterization by X-ray diffraction proves that the films are polycrystalline in a garnet phase with an average crystallite size of 34 nm. The microstructural analyses of the film surface by scanning electron microscopy and scanning probe microscopy show that the roughness Ra of the film is 31 nm. The magnetic easy axis of the YIG films is in the direction parallel to the films. We have found that the polarity of the LSSE voltage VLSSE measured with a Pt capping layer apparently differs from that observed when a W capping layer is used. The value of VLSSE increases almost linearly with increasing temperature difference Δ T independent of the choice of metal for the capping layer. The observed LSSE for the polycrystalline YIG films is one order of magnitude smaller than that reported for YIG and Bi:YIG single-crystal samples grown by metal-organic decomposition.

Original languageEnglish
Article number8463515
JournalIEEE Transactions on Magnetics
Volume55
Issue number2
DOIs
Publication statusPublished - Feb 1 2019

Fingerprint

Spin coating
Coprecipitation
Seebeck effect
Electric potential
Metals
Scanning probe microscopy
Garnets
Crystallite size
Surface roughness
Single crystals
Annealing
Decomposition
X ray diffraction
Thin films
Scanning electron microscopy
Substrates

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Cite this

Observation of longitudinal spin seebeck voltage in YIG films chemically prepared by co-precipitation and spin coating. / Yamada, Keisuke; Kurokawa, Yuichiro; Kogiso, Kazuma; Yuasa, Hiromi; Shima, Mutsuhiro.

In: IEEE Transactions on Magnetics, Vol. 55, No. 2, 8463515, 01.02.2019.

Research output: Contribution to journalArticle

@article{e720ef3b97e5417894d61b3fbd459aae,
title = "Observation of longitudinal spin seebeck voltage in YIG films chemically prepared by co-precipitation and spin coating",
abstract = "Longitudinal spin Seebeck effect (LSSE) of Y3Fe5O12 (YIG) thin films chemically prepared on a Si substrate with a SiO2 surface layer has been investigated with a particular focus on its dependence on the metal (Pt or W) for the capping layer used to carry out the measurements. The YIG films are prepared by a combination of co-precipitation, spin coating, and annealing processes. The structural characterization by X-ray diffraction proves that the films are polycrystalline in a garnet phase with an average crystallite size of 34 nm. The microstructural analyses of the film surface by scanning electron microscopy and scanning probe microscopy show that the roughness Ra of the film is 31 nm. The magnetic easy axis of the YIG films is in the direction parallel to the films. We have found that the polarity of the LSSE voltage VLSSE measured with a Pt capping layer apparently differs from that observed when a W capping layer is used. The value of VLSSE increases almost linearly with increasing temperature difference Δ T independent of the choice of metal for the capping layer. The observed LSSE for the polycrystalline YIG films is one order of magnitude smaller than that reported for YIG and Bi:YIG single-crystal samples grown by metal-organic decomposition.",
author = "Keisuke Yamada and Yuichiro Kurokawa and Kazuma Kogiso and Hiromi Yuasa and Mutsuhiro Shima",
year = "2019",
month = "2",
day = "1",
doi = "10.1109/TMAG.2018.2865199",
language = "English",
volume = "55",
journal = "IEEE Transactions on Magnetics",
issn = "0018-9464",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "2",

}

TY - JOUR

T1 - Observation of longitudinal spin seebeck voltage in YIG films chemically prepared by co-precipitation and spin coating

AU - Yamada, Keisuke

AU - Kurokawa, Yuichiro

AU - Kogiso, Kazuma

AU - Yuasa, Hiromi

AU - Shima, Mutsuhiro

PY - 2019/2/1

Y1 - 2019/2/1

N2 - Longitudinal spin Seebeck effect (LSSE) of Y3Fe5O12 (YIG) thin films chemically prepared on a Si substrate with a SiO2 surface layer has been investigated with a particular focus on its dependence on the metal (Pt or W) for the capping layer used to carry out the measurements. The YIG films are prepared by a combination of co-precipitation, spin coating, and annealing processes. The structural characterization by X-ray diffraction proves that the films are polycrystalline in a garnet phase with an average crystallite size of 34 nm. The microstructural analyses of the film surface by scanning electron microscopy and scanning probe microscopy show that the roughness Ra of the film is 31 nm. The magnetic easy axis of the YIG films is in the direction parallel to the films. We have found that the polarity of the LSSE voltage VLSSE measured with a Pt capping layer apparently differs from that observed when a W capping layer is used. The value of VLSSE increases almost linearly with increasing temperature difference Δ T independent of the choice of metal for the capping layer. The observed LSSE for the polycrystalline YIG films is one order of magnitude smaller than that reported for YIG and Bi:YIG single-crystal samples grown by metal-organic decomposition.

AB - Longitudinal spin Seebeck effect (LSSE) of Y3Fe5O12 (YIG) thin films chemically prepared on a Si substrate with a SiO2 surface layer has been investigated with a particular focus on its dependence on the metal (Pt or W) for the capping layer used to carry out the measurements. The YIG films are prepared by a combination of co-precipitation, spin coating, and annealing processes. The structural characterization by X-ray diffraction proves that the films are polycrystalline in a garnet phase with an average crystallite size of 34 nm. The microstructural analyses of the film surface by scanning electron microscopy and scanning probe microscopy show that the roughness Ra of the film is 31 nm. The magnetic easy axis of the YIG films is in the direction parallel to the films. We have found that the polarity of the LSSE voltage VLSSE measured with a Pt capping layer apparently differs from that observed when a W capping layer is used. The value of VLSSE increases almost linearly with increasing temperature difference Δ T independent of the choice of metal for the capping layer. The observed LSSE for the polycrystalline YIG films is one order of magnitude smaller than that reported for YIG and Bi:YIG single-crystal samples grown by metal-organic decomposition.

UR - http://www.scopus.com/inward/record.url?scp=85053314210&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85053314210&partnerID=8YFLogxK

U2 - 10.1109/TMAG.2018.2865199

DO - 10.1109/TMAG.2018.2865199

M3 - Article

AN - SCOPUS:85053314210

VL - 55

JO - IEEE Transactions on Magnetics

JF - IEEE Transactions on Magnetics

SN - 0018-9464

IS - 2

M1 - 8463515

ER -