Observation of vacancy in high purity silicon crystal using low-temperature ultrasonic measurements

Terutaka Goto, Hiroshi Yamada-Kaneta, Yasuhiro Saito, Yuichi Nemoto, Koji Sato, Koichi Kakimoto, Shintaro Nakamura

Research output: Contribution to journalConference articlepeer-review

8 Citations (Scopus)

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Engineering & Materials Science