Observations of grain boundary structure in submicrometer-grained Cu and Ni using high-resolution electron microscopy

Zenji Horita, David J. Smith, Minoru Nemoto, Ruslan Z. Valiev, Terence G. Langdon

Research output: Contribution to journalArticle

153 Citations (Scopus)

Abstract

Submicrometer-grained (SMG) structures were produced in Cu and Ni using an intense plastic straining technique, and the grain boundaries and their vicinities were observed by high-resolution electron microscopy. The grain boundaries exhibited zigzag configurations with irregular arrangements of facets and steps, and thus they were found to be in a high-energy nonequilibrium state. A similar conclusion was reached earlier for SMG Al-Mg solid solution alloys which have much lower melting points than Cu and Ni, suggesting that nonequilibrium grain boundaries are a typical feature of metals processed by intense plastic straining.

Original languageEnglish
Pages (from-to)446-450
Number of pages5
JournalJournal of Materials Research
Volume13
Issue number2
DOIs
Publication statusPublished - Jan 1 1998

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High resolution electron microscopy
electron microscopy
Grain boundaries
grain boundaries
high resolution
plastics
Plastics
Electron energy levels
melting points
Melting point
flat surfaces
Solid solutions
solid solutions
Metals
configurations
metals
energy

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Observations of grain boundary structure in submicrometer-grained Cu and Ni using high-resolution electron microscopy. / Horita, Zenji; Smith, David J.; Nemoto, Minoru; Valiev, Ruslan Z.; Langdon, Terence G.

In: Journal of Materials Research, Vol. 13, No. 2, 01.01.1998, p. 446-450.

Research output: Contribution to journalArticle

Horita, Zenji ; Smith, David J. ; Nemoto, Minoru ; Valiev, Ruslan Z. ; Langdon, Terence G. / Observations of grain boundary structure in submicrometer-grained Cu and Ni using high-resolution electron microscopy. In: Journal of Materials Research. 1998 ; Vol. 13, No. 2. pp. 446-450.
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