Observing impurity doping in oxide grain boundaries using STEM

J. P. Buban, Yukio Sato, K. Matsunaga, N. Shibata, T. Yamamoto, Y. Ikuhara

Research output: Contribution to journalArticle

Original languageEnglish
Pages (from-to)138-139
Number of pages2
JournalMicroscopy and Microanalysis
Volume12
Issue numberSUPPL. 2
DOIs
Publication statusPublished - Aug 1 2006

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Grain boundaries
grain boundaries
Doping (additives)
Impurities
impurities
Oxides
oxides

All Science Journal Classification (ASJC) codes

  • Instrumentation

Cite this

Buban, J. P., Sato, Y., Matsunaga, K., Shibata, N., Yamamoto, T., & Ikuhara, Y. (2006). Observing impurity doping in oxide grain boundaries using STEM. Microscopy and Microanalysis, 12(SUPPL. 2), 138-139. https://doi.org/10.1017/S143192760606507X

Observing impurity doping in oxide grain boundaries using STEM. / Buban, J. P.; Sato, Yukio; Matsunaga, K.; Shibata, N.; Yamamoto, T.; Ikuhara, Y.

In: Microscopy and Microanalysis, Vol. 12, No. SUPPL. 2, 01.08.2006, p. 138-139.

Research output: Contribution to journalArticle

Buban, JP, Sato, Y, Matsunaga, K, Shibata, N, Yamamoto, T & Ikuhara, Y 2006, 'Observing impurity doping in oxide grain boundaries using STEM', Microscopy and Microanalysis, vol. 12, no. SUPPL. 2, pp. 138-139. https://doi.org/10.1017/S143192760606507X
Buban JP, Sato Y, Matsunaga K, Shibata N, Yamamoto T, Ikuhara Y. Observing impurity doping in oxide grain boundaries using STEM. Microscopy and Microanalysis. 2006 Aug 1;12(SUPPL. 2):138-139. https://doi.org/10.1017/S143192760606507X
Buban, J. P. ; Sato, Yukio ; Matsunaga, K. ; Shibata, N. ; Yamamoto, T. ; Ikuhara, Y. / Observing impurity doping in oxide grain boundaries using STEM. In: Microscopy and Microanalysis. 2006 ; Vol. 12, No. SUPPL. 2. pp. 138-139.
@article{92fb78fa7f67496dbf33644e7903d9df,
title = "Observing impurity doping in oxide grain boundaries using STEM",
author = "Buban, {J. P.} and Yukio Sato and K. Matsunaga and N. Shibata and T. Yamamoto and Y. Ikuhara",
year = "2006",
month = "8",
day = "1",
doi = "10.1017/S143192760606507X",
language = "English",
volume = "12",
pages = "138--139",
journal = "Microscopy and Microanalysis",
issn = "1431-9276",
publisher = "Cambridge University Press",
number = "SUPPL. 2",

}

TY - JOUR

T1 - Observing impurity doping in oxide grain boundaries using STEM

AU - Buban, J. P.

AU - Sato, Yukio

AU - Matsunaga, K.

AU - Shibata, N.

AU - Yamamoto, T.

AU - Ikuhara, Y.

PY - 2006/8/1

Y1 - 2006/8/1

UR - http://www.scopus.com/inward/record.url?scp=33750888600&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=33750888600&partnerID=8YFLogxK

U2 - 10.1017/S143192760606507X

DO - 10.1017/S143192760606507X

M3 - Article

AN - SCOPUS:33750888600

VL - 12

SP - 138

EP - 139

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

SN - 1431-9276

IS - SUPPL. 2

ER -