Observing impurity doping in oxide grain boundaries using STEM

J. P. Buban, Y. Sato, K. Matsunaga, N. Shibata, T. Yamamoto, Y. Ikuhara

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)138-139
Number of pages2
JournalMicroscopy and Microanalysis
Volume12
Issue numberSUPPL. 2
DOIs
Publication statusPublished - Aug 1 2006
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Instrumentation

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