One dimensional behavior of mixed crystal BaCu2(Si1-xGex)2O7 observed by submillimeter wave ESR

H. Ohta, K. Kawakami, S. Okubo, Y. Inagaki, T. Kunimoto, Z. Hiroi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

BaCu2(Si1-xGex)2O7 (x=0.65) is a one dimensional antiferromagnet (1D AF) with the staggered g-tensor and Dzyaloshinskii-Moriya (DM) interaction. Although the system is expected to have intrinsic randomness, our submillimeter wave ESR results show the typical behavior of the 1D AF and they are discussed along with the recent ESR theory of Oshikawa and Affleck (Phys. Rev. Lett. vol. 82, p. 5136, 1999).

Original languageEnglish
Title of host publicationConference Digest - 27th International Conference on Infrared and Millimeter Waves, IRMMW 2002
EditorsRichard J. Temkin
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages323-324
Number of pages2
ISBN (Electronic)0780374231, 9780780374232
DOIs
Publication statusPublished - Jan 1 2002
Externally publishedYes
Event27th International Conference on Infrared and Millimeter Waves, IRMMW 2002 - San Diego, United States
Duration: Sep 22 2002Sep 26 2002

Publication series

NameConference Digest - 27th International Conference on Infrared and Millimeter Waves, IRMMW 2002

Other

Other27th International Conference on Infrared and Millimeter Waves, IRMMW 2002
CountryUnited States
CitySan Diego
Period9/22/029/26/02

All Science Journal Classification (ASJC) codes

  • Electrical and Electronic Engineering
  • Condensed Matter Physics
  • Instrumentation
  • Radiation

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  • Cite this

    Ohta, H., Kawakami, K., Okubo, S., Inagaki, Y., Kunimoto, T., & Hiroi, Z. (2002). One dimensional behavior of mixed crystal BaCu2(Si1-xGex)2O7 observed by submillimeter wave ESR. In R. J. Temkin (Ed.), Conference Digest - 27th International Conference on Infrared and Millimeter Waves, IRMMW 2002 (pp. 323-324). [1076215] (Conference Digest - 27th International Conference on Infrared and Millimeter Waves, IRMMW 2002). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICIMW.2002.1076215