One-shot spectrometer for several elements using an integrated conical crystal analyzer

Kohei Morishita, Kouichi Hayashi, Kazuo Nakajima

Research output: Contribution to journalReview article

2 Citations (Scopus)

Abstract

Time-resolved x-ray spectrometry using an ultrastrong x-ray source such as an x-ray free electron laser is one of the new trends in the field of x-ray physics. To achieve such time-resolved measurement, the development of an one-shot spectrometer with a wide wavelength range, high efficiency, and good energy resolution is an essential prerequisite. Here we developed an integrated conical Ge crystal analyzer consisting of several conical rings, which were connected using spline surfaces to form a single body using our previously developed hot deformation technique, which can form a Si or Ge wafer into an arbitrary and accurate shape. We simultaneously focused several characteristic lines from an alloy sample onto different positions on a small x-ray charge-coupled device with very high image brightness (gain relative to planar analyzer: 100) and a good spatial resolution of 9-13 eV. The small radius of curvature of the crystal (28-50 mm) enabled us to realize a very short sample-detector distance of 214.4 mm. The present result shows the possibility of realizing a new focusing x-ray crystal spectrograph that can control the focal position as desired.

Original languageEnglish
Article number013112
JournalReview of Scientific Instruments
Volume83
Issue number1
DOIs
Publication statusPublished - Jan 2012

Fingerprint

shot
Spectrometers
analyzers
spectrometers
X rays
Crystals
crystals
x rays
x ray lasers
x ray sources
splines
free electron lasers
spectrographs
charge coupled devices
brightness
Spectrographs
Hot working
spatial resolution
Free electron lasers
time measurement

All Science Journal Classification (ASJC) codes

  • Instrumentation

Cite this

One-shot spectrometer for several elements using an integrated conical crystal analyzer. / Morishita, Kohei; Hayashi, Kouichi; Nakajima, Kazuo.

In: Review of Scientific Instruments, Vol. 83, No. 1, 013112, 01.2012.

Research output: Contribution to journalReview article

@article{74cb8ea121c941c3a92fd405a5723cb4,
title = "One-shot spectrometer for several elements using an integrated conical crystal analyzer",
abstract = "Time-resolved x-ray spectrometry using an ultrastrong x-ray source such as an x-ray free electron laser is one of the new trends in the field of x-ray physics. To achieve such time-resolved measurement, the development of an one-shot spectrometer with a wide wavelength range, high efficiency, and good energy resolution is an essential prerequisite. Here we developed an integrated conical Ge crystal analyzer consisting of several conical rings, which were connected using spline surfaces to form a single body using our previously developed hot deformation technique, which can form a Si or Ge wafer into an arbitrary and accurate shape. We simultaneously focused several characteristic lines from an alloy sample onto different positions on a small x-ray charge-coupled device with very high image brightness (gain relative to planar analyzer: 100) and a good spatial resolution of 9-13 eV. The small radius of curvature of the crystal (28-50 mm) enabled us to realize a very short sample-detector distance of 214.4 mm. The present result shows the possibility of realizing a new focusing x-ray crystal spectrograph that can control the focal position as desired.",
author = "Kohei Morishita and Kouichi Hayashi and Kazuo Nakajima",
year = "2012",
month = "1",
doi = "10.1063/1.3677326",
language = "English",
volume = "83",
journal = "Review of Scientific Instruments",
issn = "0034-6748",
publisher = "American Institute of Physics Publising LLC",
number = "1",

}

TY - JOUR

T1 - One-shot spectrometer for several elements using an integrated conical crystal analyzer

AU - Morishita, Kohei

AU - Hayashi, Kouichi

AU - Nakajima, Kazuo

PY - 2012/1

Y1 - 2012/1

N2 - Time-resolved x-ray spectrometry using an ultrastrong x-ray source such as an x-ray free electron laser is one of the new trends in the field of x-ray physics. To achieve such time-resolved measurement, the development of an one-shot spectrometer with a wide wavelength range, high efficiency, and good energy resolution is an essential prerequisite. Here we developed an integrated conical Ge crystal analyzer consisting of several conical rings, which were connected using spline surfaces to form a single body using our previously developed hot deformation technique, which can form a Si or Ge wafer into an arbitrary and accurate shape. We simultaneously focused several characteristic lines from an alloy sample onto different positions on a small x-ray charge-coupled device with very high image brightness (gain relative to planar analyzer: 100) and a good spatial resolution of 9-13 eV. The small radius of curvature of the crystal (28-50 mm) enabled us to realize a very short sample-detector distance of 214.4 mm. The present result shows the possibility of realizing a new focusing x-ray crystal spectrograph that can control the focal position as desired.

AB - Time-resolved x-ray spectrometry using an ultrastrong x-ray source such as an x-ray free electron laser is one of the new trends in the field of x-ray physics. To achieve such time-resolved measurement, the development of an one-shot spectrometer with a wide wavelength range, high efficiency, and good energy resolution is an essential prerequisite. Here we developed an integrated conical Ge crystal analyzer consisting of several conical rings, which were connected using spline surfaces to form a single body using our previously developed hot deformation technique, which can form a Si or Ge wafer into an arbitrary and accurate shape. We simultaneously focused several characteristic lines from an alloy sample onto different positions on a small x-ray charge-coupled device with very high image brightness (gain relative to planar analyzer: 100) and a good spatial resolution of 9-13 eV. The small radius of curvature of the crystal (28-50 mm) enabled us to realize a very short sample-detector distance of 214.4 mm. The present result shows the possibility of realizing a new focusing x-ray crystal spectrograph that can control the focal position as desired.

UR - http://www.scopus.com/inward/record.url?scp=84859195991&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84859195991&partnerID=8YFLogxK

U2 - 10.1063/1.3677326

DO - 10.1063/1.3677326

M3 - Review article

C2 - 22299934

AN - SCOPUS:84859195991

VL - 83

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

SN - 0034-6748

IS - 1

M1 - 013112

ER -