TY - GEN
T1 - Operator-based nonlinear fault detection and fault tolerance control for microreactor with generalized Gaussian function
AU - Ogihara, Yoshiki
AU - Deng, Mingcong
AU - Noge, Yuichi
PY - 2019/7
Y1 - 2019/7
N2 - In this paper, operator-based method of fault detection and fault tolerance control using generalized Gaussian function as the kernel function of Support Vector Machine (SVM) is proposed for microreactor units actuated by Peltier device. In details, after describing a mathematical model of the microreactor, an operator-based robust fault tolerant control system is designed for this process with output sensor fault. Then real-Time fault detection scheme is presented by using SVM, where generalized Gaussian function is adopted as the kernel function. The effectiveness of the proposed method is confirmed by simulation and experimental result.
AB - In this paper, operator-based method of fault detection and fault tolerance control using generalized Gaussian function as the kernel function of Support Vector Machine (SVM) is proposed for microreactor units actuated by Peltier device. In details, after describing a mathematical model of the microreactor, an operator-based robust fault tolerant control system is designed for this process with output sensor fault. Then real-Time fault detection scheme is presented by using SVM, where generalized Gaussian function is adopted as the kernel function. The effectiveness of the proposed method is confirmed by simulation and experimental result.
UR - http://www.scopus.com/inward/record.url?scp=85073548559&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85073548559&partnerID=8YFLogxK
U2 - 10.1109/ICIAI.2019.8850831
DO - 10.1109/ICIAI.2019.8850831
M3 - Conference contribution
T3 - 1st International Conference on Industrial Artificial Intelligence, IAI 2019
BT - 1st International Conference on Industrial Artificial Intelligence, IAI 2019
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 1st International Conference on Industrial Artificial Intelligence, IAI 2019
Y2 - 22 July 2019 through 26 July 2019
ER -