Optical-beam-induced-current analysis of wear-out degradation in high-reliability Fabry-Perot laser diodes for access networks

Tsuyoshi Ito, Tatsuya Takeshita, Mitsuru Sugo, Takeshi Kurosaki, Yuji Akatsu, Kazutoshi Kato

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Reliability of a Fabry-Perot laser diode (FP-LD) that was developed for use in the bi-directional optical subassembly of access networks was investigated. Stable operation, which was closely related to the wear-out degradation, was confirmed from the results of an accelerated aging test at 85 °C, and a lifetime of over 2 × 105 h was estimated. To examine the behavior of the wear-out degradation in the FP-LD, we employed an optical-beam-induced-current (OBIC) analysis. From the results of the OBIC analysis, we found that large degradation occurs in the SCH layer rather than in the active layer in the early stage of the FP-LD's life.

Original languageEnglish
Pages (from-to)4523-4526
Number of pages4
JournalJapanese Journal of Applied Physics
Volume47
Issue number6 PART 1
DOIs
Publication statusPublished - Jun 13 2008
Externally publishedYes

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Induced currents
Semiconductor lasers
semiconductor lasers
Wear of materials
degradation
Degradation
subassemblies
lasers
Aging of materials
life (durability)

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

Optical-beam-induced-current analysis of wear-out degradation in high-reliability Fabry-Perot laser diodes for access networks. / Ito, Tsuyoshi; Takeshita, Tatsuya; Sugo, Mitsuru; Kurosaki, Takeshi; Akatsu, Yuji; Kato, Kazutoshi.

In: Japanese Journal of Applied Physics, Vol. 47, No. 6 PART 1, 13.06.2008, p. 4523-4526.

Research output: Contribution to journalArticle

Ito, Tsuyoshi ; Takeshita, Tatsuya ; Sugo, Mitsuru ; Kurosaki, Takeshi ; Akatsu, Yuji ; Kato, Kazutoshi. / Optical-beam-induced-current analysis of wear-out degradation in high-reliability Fabry-Perot laser diodes for access networks. In: Japanese Journal of Applied Physics. 2008 ; Vol. 47, No. 6 PART 1. pp. 4523-4526.
@article{603cbf5dbfc549d89a15336725740328,
title = "Optical-beam-induced-current analysis of wear-out degradation in high-reliability Fabry-Perot laser diodes for access networks",
abstract = "Reliability of a Fabry-Perot laser diode (FP-LD) that was developed for use in the bi-directional optical subassembly of access networks was investigated. Stable operation, which was closely related to the wear-out degradation, was confirmed from the results of an accelerated aging test at 85 °C, and a lifetime of over 2 × 105 h was estimated. To examine the behavior of the wear-out degradation in the FP-LD, we employed an optical-beam-induced-current (OBIC) analysis. From the results of the OBIC analysis, we found that large degradation occurs in the SCH layer rather than in the active layer in the early stage of the FP-LD's life.",
author = "Tsuyoshi Ito and Tatsuya Takeshita and Mitsuru Sugo and Takeshi Kurosaki and Yuji Akatsu and Kazutoshi Kato",
year = "2008",
month = "6",
day = "13",
doi = "10.1143/JJAP.47.4523",
language = "English",
volume = "47",
pages = "4523--4526",
journal = "Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes",
issn = "0021-4922",
publisher = "Institute of Physics",
number = "6 PART 1",

}

TY - JOUR

T1 - Optical-beam-induced-current analysis of wear-out degradation in high-reliability Fabry-Perot laser diodes for access networks

AU - Ito, Tsuyoshi

AU - Takeshita, Tatsuya

AU - Sugo, Mitsuru

AU - Kurosaki, Takeshi

AU - Akatsu, Yuji

AU - Kato, Kazutoshi

PY - 2008/6/13

Y1 - 2008/6/13

N2 - Reliability of a Fabry-Perot laser diode (FP-LD) that was developed for use in the bi-directional optical subassembly of access networks was investigated. Stable operation, which was closely related to the wear-out degradation, was confirmed from the results of an accelerated aging test at 85 °C, and a lifetime of over 2 × 105 h was estimated. To examine the behavior of the wear-out degradation in the FP-LD, we employed an optical-beam-induced-current (OBIC) analysis. From the results of the OBIC analysis, we found that large degradation occurs in the SCH layer rather than in the active layer in the early stage of the FP-LD's life.

AB - Reliability of a Fabry-Perot laser diode (FP-LD) that was developed for use in the bi-directional optical subassembly of access networks was investigated. Stable operation, which was closely related to the wear-out degradation, was confirmed from the results of an accelerated aging test at 85 °C, and a lifetime of over 2 × 105 h was estimated. To examine the behavior of the wear-out degradation in the FP-LD, we employed an optical-beam-induced-current (OBIC) analysis. From the results of the OBIC analysis, we found that large degradation occurs in the SCH layer rather than in the active layer in the early stage of the FP-LD's life.

UR - http://www.scopus.com/inward/record.url?scp=55049113941&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=55049113941&partnerID=8YFLogxK

U2 - 10.1143/JJAP.47.4523

DO - 10.1143/JJAP.47.4523

M3 - Article

AN - SCOPUS:55049113941

VL - 47

SP - 4523

EP - 4526

JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

SN - 0021-4922

IS - 6 PART 1

ER -