Optical-beam-induced-current analysis of wear-out degradation in high-reliability Fabry-Perot laser diodes for access networks

Tsuyoshi Ito, Tatsuya Takeshita, Mitsuru Sugo, Takeshi Kurosaki, Yuji Akatsu, Kazutoshi Kato

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Reliability of a Fabry-Perot laser diode (FP-LD) that was developed for use in the bi-directional optical subassembly of access networks was investigated. Stable operation, which was closely related to the wear-out degradation, was confirmed from the results of an accelerated aging test at 85 °C, and a lifetime of over 2 × 105 h was estimated. To examine the behavior of the wear-out degradation in the FP-LD, we employed an optical-beam-induced-current (OBIC) analysis. From the results of the OBIC analysis, we found that large degradation occurs in the SCH layer rather than in the active layer in the early stage of the FP-LD's life.

Original languageEnglish
Pages (from-to)4523-4526
Number of pages4
JournalJapanese Journal of Applied Physics
Volume47
Issue number6 PART 1
DOIs
Publication statusPublished - Jun 13 2008
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Engineering(all)
  • Physics and Astronomy(all)

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