Optical-beam-induced-current analysis of wear-out degradation in high-reliability Fabry-Perot laser diodes for access networks

Tsuyoshi Ito, Tatsuya Takeshita, Mitsuru Sugo, Takeshi Kurosaki, Yuji Akatsu, Kazutoshi Kato

Research output: Contribution to journalArticlepeer-review

3 Citations (Scopus)

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Engineering & Materials Science

Physics & Astronomy