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Optical-beam-induced-current analysis of wear-out degradation in high-reliability Fabry-Perot laser diodes for access networks
Tsuyoshi Ito, Tatsuya Takeshita, Mitsuru Sugo, Takeshi Kurosaki, Yuji Akatsu, Kazutoshi Kato
Research output: Contribution to journal › Article › peer-review
3
Citations
(Scopus)