Optical image analysis of the novel ultra-lightweight and high-resolution MEMS X-ray optics

I. Mitsuishi, Y. Ezoe, U. Takagi, T. Hayashi, T. Sato, K. Morishita, K. Nakajima, N. Y. Yamasaki, K. Mitsuda

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Citations (Scopus)

Abstract

We invented novel ultra-lightweight and high-resolution MEMS (Micro Electro Mechanical Systems) X-ray optics for space X-ray telescopes. As a first step of R&D, we conducted optical image analysis of a spherically-shaped test optic with a radius of curvature of 1000 mm. Focusing of the parallel light was verified with our optic for the first time.

Original languageEnglish
Title of host publication2009 IEEE/LEOS International Conference on Optical MEMS and Nanophotonics, OPTMEMS 2009
Pages123-124
Number of pages2
DOIs
Publication statusPublished - Dec 16 2009
Externally publishedYes
Event2009 IEEE/LEOS International Conference on Optical MEMS and Nanophotonics, OPTMEMS 2009 - Clearwater, FL, United States
Duration: Aug 17 2009Aug 20 2009

Publication series

Name2009 IEEE/LEOS International Conference on Optical MEMS and Nanophotonics, OPTMEMS 2009

Other

Other2009 IEEE/LEOS International Conference on Optical MEMS and Nanophotonics, OPTMEMS 2009
CountryUnited States
CityClearwater, FL
Period8/17/098/20/09

Fingerprint

X ray optics
Optical resolving power
Image analysis
Optics
Telescopes
X rays

All Science Journal Classification (ASJC) codes

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Mitsuishi, I., Ezoe, Y., Takagi, U., Hayashi, T., Sato, T., Morishita, K., ... Mitsuda, K. (2009). Optical image analysis of the novel ultra-lightweight and high-resolution MEMS X-ray optics. In 2009 IEEE/LEOS International Conference on Optical MEMS and Nanophotonics, OPTMEMS 2009 (pp. 123-124). [5338574] (2009 IEEE/LEOS International Conference on Optical MEMS and Nanophotonics, OPTMEMS 2009). https://doi.org/10.1109/OMEMS.2009.5338574

Optical image analysis of the novel ultra-lightweight and high-resolution MEMS X-ray optics. / Mitsuishi, I.; Ezoe, Y.; Takagi, U.; Hayashi, T.; Sato, T.; Morishita, K.; Nakajima, K.; Yamasaki, N. Y.; Mitsuda, K.

2009 IEEE/LEOS International Conference on Optical MEMS and Nanophotonics, OPTMEMS 2009. 2009. p. 123-124 5338574 (2009 IEEE/LEOS International Conference on Optical MEMS and Nanophotonics, OPTMEMS 2009).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Mitsuishi, I, Ezoe, Y, Takagi, U, Hayashi, T, Sato, T, Morishita, K, Nakajima, K, Yamasaki, NY & Mitsuda, K 2009, Optical image analysis of the novel ultra-lightweight and high-resolution MEMS X-ray optics. in 2009 IEEE/LEOS International Conference on Optical MEMS and Nanophotonics, OPTMEMS 2009., 5338574, 2009 IEEE/LEOS International Conference on Optical MEMS and Nanophotonics, OPTMEMS 2009, pp. 123-124, 2009 IEEE/LEOS International Conference on Optical MEMS and Nanophotonics, OPTMEMS 2009, Clearwater, FL, United States, 8/17/09. https://doi.org/10.1109/OMEMS.2009.5338574
Mitsuishi I, Ezoe Y, Takagi U, Hayashi T, Sato T, Morishita K et al. Optical image analysis of the novel ultra-lightweight and high-resolution MEMS X-ray optics. In 2009 IEEE/LEOS International Conference on Optical MEMS and Nanophotonics, OPTMEMS 2009. 2009. p. 123-124. 5338574. (2009 IEEE/LEOS International Conference on Optical MEMS and Nanophotonics, OPTMEMS 2009). https://doi.org/10.1109/OMEMS.2009.5338574
Mitsuishi, I. ; Ezoe, Y. ; Takagi, U. ; Hayashi, T. ; Sato, T. ; Morishita, K. ; Nakajima, K. ; Yamasaki, N. Y. ; Mitsuda, K. / Optical image analysis of the novel ultra-lightweight and high-resolution MEMS X-ray optics. 2009 IEEE/LEOS International Conference on Optical MEMS and Nanophotonics, OPTMEMS 2009. 2009. pp. 123-124 (2009 IEEE/LEOS International Conference on Optical MEMS and Nanophotonics, OPTMEMS 2009).
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