Optical Properties of Ultrathin Poly(3,4-ethylenedioxythiophene) Films at Several Doping Levels Studied by In Situ Electrochemical Surface Plasmon Resonance Spectroscopy

Akira Baba; Jörn Lübben; Kaoru Tamada; Wolfgang Knoll

doi:10.1021/la034848n

Optical Properties of Ultrathin Poly(3,4-ethylenedioxythiophene) Films at Several Doping Levels Studied by In Situ Electrochemical Surface Plasmon Resonance Spectroscopy

Akira Baba, Jörn Lübben, Kaoru Tamada, Wolfgang Knoll

Research output: Contribution to journal › Article › peer-review

33 Citations (Scopus)

Abstract

In this paper, we report on in situ optical/electrochemical investigations using a combination of surface plasmon resonance spectroscopy and electrochemistry in order to determine the complex dielectric constants of poly(3,4-ethylenedioxythiophene) (PEDOT) thin films. The PEDOT films were deposited by in situ electropolymerization. The film thickness was monitored by a quartz crystal microbalance. In the electrochemical surface plasmon resonance (EC-SPR) measurements, three wavelengths corresponding to interband and intraband electronic transition regions were used in order to investigate electrochromic properties. The optical conductivity was also determined by EC-SPR measurement with a near-infrared laser wavelength which corresponds to the region outside the anomalous dispersion.

Original language	English
Pages (from-to)	9058-9064
Number of pages	7
Journal	Langmuir
Volume	19
Issue number	21
DOIs	https://doi.org/10.1021/la034848n
Publication status	Published - Oct 14 2003
Externally published	Yes

All Science Journal Classification (ASJC) codes

Materials Science(all)
Condensed Matter Physics
Surfaces and Interfaces
Spectroscopy
Electrochemistry

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abstract = "In this paper, we report on in situ optical/electrochemical investigations using a combination of surface plasmon resonance spectroscopy and electrochemistry in order to determine the complex dielectric constants of poly(3,4-ethylenedioxythiophene) (PEDOT) thin films. The PEDOT films were deposited by in situ electropolymerization. The film thickness was monitored by a quartz crystal microbalance. In the electrochemical surface plasmon resonance (EC-SPR) measurements, three wavelengths corresponding to interband and intraband electronic transition regions were used in order to investigate electrochromic properties. The optical conductivity was also determined by EC-SPR measurement with a near-infrared laser wavelength which corresponds to the region outside the anomalous dispersion.",

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AU - Baba, Akira

AU - Lübben, Jörn

AU - Tamada, Kaoru

AU - Knoll, Wolfgang

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AB - In this paper, we report on in situ optical/electrochemical investigations using a combination of surface plasmon resonance spectroscopy and electrochemistry in order to determine the complex dielectric constants of poly(3,4-ethylenedioxythiophene) (PEDOT) thin films. The PEDOT films were deposited by in situ electropolymerization. The film thickness was monitored by a quartz crystal microbalance. In the electrochemical surface plasmon resonance (EC-SPR) measurements, three wavelengths corresponding to interband and intraband electronic transition regions were used in order to investigate electrochromic properties. The optical conductivity was also determined by EC-SPR measurement with a near-infrared laser wavelength which corresponds to the region outside the anomalous dispersion.

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Optical Properties of Ultrathin Poly(3,4-ethylenedioxythiophene) Films at Several Doping Levels Studied by In Situ Electrochemical Surface Plasmon Resonance Spectroscopy

Abstract

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