Optimization of negative ion sources for a heavy-ion-beam probe

M. Nishiura, T. Ido, A. Shimizu, S. Kato, K. Tsukada, A. Nishizawa, Y. Hamada, Y. Matsumoto, A. Mendenilla, M. Wada

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Abstract

The development of plasma-sputter-type negative ion sources is underway for the heavy-ion-beam probe system as plasma diagnostic beams of the large helical device (LHD) for potential and fluctuation field measurements. Our purpose is to increase the doubly charged exchanged Au+ beam intensity to enhance the detection signal after passing through the plasmas of the LHD. For this purpose, the characterization of the Au- ion source and the beam optics has been carried out both experimentally and numerically. Based on these results, a new plasma-sputter-type negative ion source is designed and tested.

Original languageEnglish
Article number03A537
JournalReview of Scientific Instruments
Volume77
Issue number3
DOIs
Publication statusPublished - Mar 1 2006

All Science Journal Classification (ASJC) codes

  • Instrumentation

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    Nishiura, M., Ido, T., Shimizu, A., Kato, S., Tsukada, K., Nishizawa, A., Hamada, Y., Matsumoto, Y., Mendenilla, A., & Wada, M. (2006). Optimization of negative ion sources for a heavy-ion-beam probe. Review of Scientific Instruments, 77(3), [03A537]. https://doi.org/10.1063/1.2170094