Optimization of test accesses with a combined BIST and external test scheme

M. Sugihara, H. Yasuura

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Fingerprint Dive into the research topics of 'Optimization of test accesses with a combined BIST and external test scheme'. Together they form a unique fingerprint.

Engineering & Materials Science