Percolation model of excess electrical noise in transition-edge sensors

M. A. Lindeman, M. B. Anderson, S. R. Bandler, N. Bilgri, J. Chervenak, S. Gwynne Crowder, S. Fallows, E. Figueroa-Feliciano, F. Finkbeiner, N. Iyomoto, R. Kelley, C. A. Kilbourne, T. Lai, J. Man, D. McCammon, K. L. Nelms, F. S. Porter, L. E. Rocks, T. Saab, J. SadleirG. Vidugiris

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

We present a geometrical model to describe excess electrical noise in transition-edge sensors (TESs). In this model, a network of fluctuating resistors represents the complex dynamics inside a TES. The fluctuations can cause several resistors in series to become superconducting. Such events short out part of the TES and generate noise because much of the current percolates through low resistance paths. The model predicts that excess white noise increases with decreasing TES bias resistance (R/RN) and that perpendicular zebra stripes reduce noise and alpha of the TES by reducing percolation.

Original languageEnglish
Pages (from-to)715-717
Number of pages3
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume559
Issue number2
DOIs
Publication statusPublished - Apr 14 2006
Externally publishedYes

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sensors
Sensors
resistors
Resistors
low resistance
White noise
white noise
causes

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Instrumentation

Cite this

Percolation model of excess electrical noise in transition-edge sensors. / Lindeman, M. A.; Anderson, M. B.; Bandler, S. R.; Bilgri, N.; Chervenak, J.; Gwynne Crowder, S.; Fallows, S.; Figueroa-Feliciano, E.; Finkbeiner, F.; Iyomoto, N.; Kelley, R.; Kilbourne, C. A.; Lai, T.; Man, J.; McCammon, D.; Nelms, K. L.; Porter, F. S.; Rocks, L. E.; Saab, T.; Sadleir, J.; Vidugiris, G.

In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 559, No. 2, 14.04.2006, p. 715-717.

Research output: Contribution to journalArticle

Lindeman, MA, Anderson, MB, Bandler, SR, Bilgri, N, Chervenak, J, Gwynne Crowder, S, Fallows, S, Figueroa-Feliciano, E, Finkbeiner, F, Iyomoto, N, Kelley, R, Kilbourne, CA, Lai, T, Man, J, McCammon, D, Nelms, KL, Porter, FS, Rocks, LE, Saab, T, Sadleir, J & Vidugiris, G 2006, 'Percolation model of excess electrical noise in transition-edge sensors', Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, vol. 559, no. 2, pp. 715-717. https://doi.org/10.1016/j.nima.2005.12.114
Lindeman, M. A. ; Anderson, M. B. ; Bandler, S. R. ; Bilgri, N. ; Chervenak, J. ; Gwynne Crowder, S. ; Fallows, S. ; Figueroa-Feliciano, E. ; Finkbeiner, F. ; Iyomoto, N. ; Kelley, R. ; Kilbourne, C. A. ; Lai, T. ; Man, J. ; McCammon, D. ; Nelms, K. L. ; Porter, F. S. ; Rocks, L. E. ; Saab, T. ; Sadleir, J. ; Vidugiris, G. / Percolation model of excess electrical noise in transition-edge sensors. In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 2006 ; Vol. 559, No. 2. pp. 715-717.
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AU - Lindeman, M. A.

AU - Anderson, M. B.

AU - Bandler, S. R.

AU - Bilgri, N.

AU - Chervenak, J.

AU - Gwynne Crowder, S.

AU - Fallows, S.

AU - Figueroa-Feliciano, E.

AU - Finkbeiner, F.

AU - Iyomoto, N.

AU - Kelley, R.

AU - Kilbourne, C. A.

AU - Lai, T.

AU - Man, J.

AU - McCammon, D.

AU - Nelms, K. L.

AU - Porter, F. S.

AU - Rocks, L. E.

AU - Saab, T.

AU - Sadleir, J.

AU - Vidugiris, G.

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AB - We present a geometrical model to describe excess electrical noise in transition-edge sensors (TESs). In this model, a network of fluctuating resistors represents the complex dynamics inside a TES. The fluctuations can cause several resistors in series to become superconducting. Such events short out part of the TES and generate noise because much of the current percolates through low resistance paths. The model predicts that excess white noise increases with decreasing TES bias resistance (R/RN) and that perpendicular zebra stripes reduce noise and alpha of the TES by reducing percolation.

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