Permutation entropy and statistical complexity in characterising low-aspect-ratio reversed-field pinch plasma

T. Onchi, A. Fujisawa, A. Sanpei, H. Himura, S. Masamune

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Abstract

Permutation entropy and statistical complexity are measures for complex time series. The Bandt-Pompe methodology evaluates probability distribution using permutation. The method is robust and effective to quantify information of time series data. Statistical complexity is the product of Jensen-Shannon divergence and permutation entropy. These physical parameters are introduced to analyse time series of emission and magnetic fluctuations in low-aspect-ratio reversed-field pinch (RFP) plasma. The observed time-series data aggregates in a region of the plane, the so-called C-H plane, determined by entropy versus complexity. The C-H plane is a representation space used for distinguishing periodic, chaos, stochastic and noisy processes of time series data. The characteristics of the emissions and magnetic fluctuation change under different RFP-plasma conditions. The statistical complexities of soft x-ray emissions and magnetic fluctuations depend on the relationships between reversal and pinch parameters.

Original languageEnglish
Article number055601
JournalPhysica Scripta
Volume92
Issue number5
DOIs
Publication statusPublished - Apr 6 2017

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All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • Mathematical Physics
  • Condensed Matter Physics

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