Phosphorescence quenching of fac-tris(2-phenylpyridyl)iridium(III) complexes in thin films on dielectric surfaces

J. C. Ribierre, A. Ruseckas, S. V. Staton, K. Knights, N. Cumpstey, P. L. Burn, I. D.W. Samuel

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

We study the influence of the film thickness on the time-resolved phosphorescence and the luminescence quantum yield of fac-tris(2-phenylpyridyl)iridium(iii) [Ir(ppy)3]-cored dendrimers deposited on dielectric substrates. A correlation is observed between the surface quenching velocity and the quenching rate by intermolecular interactions in the bulk film, which suggests that both processes are controlled by dipole-dipole interactions between Ir(ppy)3 complexes at the core of the dendrimers. It is also found that the surface quenching velocity decreases as the refractive index of the substrate is increased. This can be explained by partial screening of dipole-dipole interactions by the dielectric environment.

Original languageEnglish
Pages (from-to)3575-3580
Number of pages6
JournalPhysical Chemistry Chemical Physics
Volume18
Issue number5
DOIs
Publication statusPublished - Jan 1 2016

Fingerprint

Iridium
Phosphorescence
phosphorescence
iridium
Dendrimers
Quenching
quenching
dipoles
Thin films
dendrimers
thin films
Quantum yield
Substrates
Film thickness
Luminescence
Refractive index
Screening
interactions
film thickness
screening

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)
  • Physical and Theoretical Chemistry

Cite this

Ribierre, J. C., Ruseckas, A., Staton, S. V., Knights, K., Cumpstey, N., Burn, P. L., & Samuel, I. D. W. (2016). Phosphorescence quenching of fac-tris(2-phenylpyridyl)iridium(III) complexes in thin films on dielectric surfaces. Physical Chemistry Chemical Physics, 18(5), 3575-3580. https://doi.org/10.1039/c5cp06584d

Phosphorescence quenching of fac-tris(2-phenylpyridyl)iridium(III) complexes in thin films on dielectric surfaces. / Ribierre, J. C.; Ruseckas, A.; Staton, S. V.; Knights, K.; Cumpstey, N.; Burn, P. L.; Samuel, I. D.W.

In: Physical Chemistry Chemical Physics, Vol. 18, No. 5, 01.01.2016, p. 3575-3580.

Research output: Contribution to journalArticle

Ribierre, JC, Ruseckas, A, Staton, SV, Knights, K, Cumpstey, N, Burn, PL & Samuel, IDW 2016, 'Phosphorescence quenching of fac-tris(2-phenylpyridyl)iridium(III) complexes in thin films on dielectric surfaces', Physical Chemistry Chemical Physics, vol. 18, no. 5, pp. 3575-3580. https://doi.org/10.1039/c5cp06584d
Ribierre, J. C. ; Ruseckas, A. ; Staton, S. V. ; Knights, K. ; Cumpstey, N. ; Burn, P. L. ; Samuel, I. D.W. / Phosphorescence quenching of fac-tris(2-phenylpyridyl)iridium(III) complexes in thin films on dielectric surfaces. In: Physical Chemistry Chemical Physics. 2016 ; Vol. 18, No. 5. pp. 3575-3580.
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