Photoemission microscopy for surface states of copper measured at different photoelectron energies

T. Sugiyama, M. Aida, N. Ueno, T. Munakata

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Abstract

We have applied microspot photoemission spectroscopy to the surface imaging of a polycrystalline Cu plate with a lateral resolution of 0.3 μm and an energy resolution of 30 meV. The images of the crystalline islands with the (1 1 1) surface were measured by detecting photoelectrons due to the Shockley surface state (SS) and the sp-band specific to the (1 1 1) surface. The dependence of the images on the photoelectron energies was related to the mean length of the (1 1 1) terrace. The (1 1 1) island measured with the photoelectron close to the work function cutoff was found to be shifted from that measured with the Shockley state. The result demonstrates that the very high-energy resolution is essential for precise understanding of the surface images.

Original languageEnglish
Pages (from-to)1167-1169
Number of pages3
JournalJournal of Electron Spectroscopy and Related Phenomena
Volume144-147
DOIs
Publication statusPublished - Jun 1 2005
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Radiation
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Spectroscopy
  • Physical and Theoretical Chemistry

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