Photoluminescence of (Zno)0.82(inn)0.18 films: Incident light angle dependence

Nanoka Miyahara, Kazuya Iwasaki, Daisuke Yamashita, Daisuke Nakamura, Hyunwoong Seo, Kazunori Koga, Masaharu Shiratani, Naho Itagaki

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We have fabricated a new semiconducting material, (ZnO)x(InN)1-x (called ZION hereafter), which is a pseudo-binary alloy of wurtzite ZnO (band gap: 3.4 eV) and wurtzite InN (band gap: 0.7 eV). We have succeeded in fabricating epitaxial (ZnO)0.82(InN)0.18 films on ZnO templates by RF magnetron sputtering. XRD measurements show that the full width at half maximum of the rocking curves from (101) plane and (002) plane are significantly small of 0.11˚ and 0.16˚, respectively, indicating good in-plane and out-of-plane crystal alignment. High crystal quality of the films was also proved by deducing the defect density from XRD analysis showing that the edge type dislocation density is low of 8.2×108 cm-2. Furthermore, we observed room temperature photoluminescence from ZION films as a parameter of incident angle of He-Cd laser light. The results indicate that an emission peak of 2.79 eV is originated from ZION.

Original languageEnglish
Title of host publicationTHERMEC 2018
EditorsM. Jeandin, R. Shabadi, Mihail Ionescu, Tara Chandra, C. Richard
PublisherTrans Tech Publications Ltd
Pages2099-2103
Number of pages5
ISBN (Print)9783035712087
DOIs
Publication statusPublished - Jan 1 2018
Event10th International Conference on Processing and Manufacturing of Advanced Materials, 2018 - Paris, France
Duration: Jul 9 2018Jul 13 2018

Publication series

NameMaterials Science Forum
Volume941 MSF
ISSN (Print)0255-5476

Conference

Conference10th International Conference on Processing and Manufacturing of Advanced Materials, 2018
CountryFrance
CityParis
Period7/9/187/13/18

Fingerprint

Photoluminescence
photoluminescence
wurtzite
Energy gap
Crystals
Defect density
Binary alloys
binary alloys
Full width at half maximum
Magnetron sputtering
crystals
magnetron sputtering
templates
alignment
Lasers
defects
room temperature
curves
lasers
Temperature

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Cite this

Miyahara, N., Iwasaki, K., Yamashita, D., Nakamura, D., Seo, H., Koga, K., ... Itagaki, N. (2018). Photoluminescence of (Zno)0.82(inn)0.18 films: Incident light angle dependence. In M. Jeandin, R. Shabadi, M. Ionescu, T. Chandra, & C. Richard (Eds.), THERMEC 2018 (pp. 2099-2103). (Materials Science Forum; Vol. 941 MSF). Trans Tech Publications Ltd. https://doi.org/10.4028/www.scientific.net/MSF.941.2099

Photoluminescence of (Zno)0.82(inn)0.18 films : Incident light angle dependence. / Miyahara, Nanoka; Iwasaki, Kazuya; Yamashita, Daisuke; Nakamura, Daisuke; Seo, Hyunwoong; Koga, Kazunori; Shiratani, Masaharu; Itagaki, Naho.

THERMEC 2018. ed. / M. Jeandin; R. Shabadi; Mihail Ionescu; Tara Chandra; C. Richard. Trans Tech Publications Ltd, 2018. p. 2099-2103 (Materials Science Forum; Vol. 941 MSF).

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Miyahara, N, Iwasaki, K, Yamashita, D, Nakamura, D, Seo, H, Koga, K, Shiratani, M & Itagaki, N 2018, Photoluminescence of (Zno)0.82(inn)0.18 films: Incident light angle dependence. in M Jeandin, R Shabadi, M Ionescu, T Chandra & C Richard (eds), THERMEC 2018. Materials Science Forum, vol. 941 MSF, Trans Tech Publications Ltd, pp. 2099-2103, 10th International Conference on Processing and Manufacturing of Advanced Materials, 2018, Paris, France, 7/9/18. https://doi.org/10.4028/www.scientific.net/MSF.941.2099
Miyahara N, Iwasaki K, Yamashita D, Nakamura D, Seo H, Koga K et al. Photoluminescence of (Zno)0.82(inn)0.18 films: Incident light angle dependence. In Jeandin M, Shabadi R, Ionescu M, Chandra T, Richard C, editors, THERMEC 2018. Trans Tech Publications Ltd. 2018. p. 2099-2103. (Materials Science Forum). https://doi.org/10.4028/www.scientific.net/MSF.941.2099
Miyahara, Nanoka ; Iwasaki, Kazuya ; Yamashita, Daisuke ; Nakamura, Daisuke ; Seo, Hyunwoong ; Koga, Kazunori ; Shiratani, Masaharu ; Itagaki, Naho. / Photoluminescence of (Zno)0.82(inn)0.18 films : Incident light angle dependence. THERMEC 2018. editor / M. Jeandin ; R. Shabadi ; Mihail Ionescu ; Tara Chandra ; C. Richard. Trans Tech Publications Ltd, 2018. pp. 2099-2103 (Materials Science Forum).
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