TY - GEN
T1 - Planar electrostatic inkjet device with gate electrodes
AU - Matsuzaki, Kazunari
AU - Ishida, Yuji
AU - Yoshida, Atsunobu
AU - Baba, Akiyoshi
AU - Asano, Tanemasa
PY - 2003/1/1
Y1 - 2003/1/1
N2 - In recent studies, capillary nozzles were analyzed and tested as electrostatic inkjet devices. These devices consist of capillary tubes and counter electrodes. Printed materials are set between these two parts, so that the material thickness affects the gap length. In order to overcome this constraint, we propose a planar electrostatic inkjet device with gate electrodes to expand the application and also enhance the conformity to micro process. In this paper, we investigate the inkjet behavior in the proposed device by fabricating a prototype planar device.
AB - In recent studies, capillary nozzles were analyzed and tested as electrostatic inkjet devices. These devices consist of capillary tubes and counter electrodes. Printed materials are set between these two parts, so that the material thickness affects the gap length. In order to overcome this constraint, we propose a planar electrostatic inkjet device with gate electrodes to expand the application and also enhance the conformity to micro process. In this paper, we investigate the inkjet behavior in the proposed device by fabricating a prototype planar device.
UR - http://www.scopus.com/inward/record.url?scp=84949227954&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84949227954&partnerID=8YFLogxK
U2 - 10.1109/IMNC.2003.1268639
DO - 10.1109/IMNC.2003.1268639
M3 - Conference contribution
AN - SCOPUS:84949227954
T3 - Digest of Papers - Microprocesses and Nanotechnology 2003 - 2003 International Microprocesses and Nanotechnology Conference, MNC 2003
SP - 190
EP - 191
BT - Digest of Papers - Microprocesses and Nanotechnology 2003 - 2003 International Microprocesses and Nanotechnology Conference, MNC 2003
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - International Microprocesses and Nanotechnology Conference, MNC 2003
Y2 - 29 October 2003 through 31 October 2003
ER -