Plastically deformed Ge-crystal wafers as elements for neutron focusing monochromator

H. Hiraka, K. Ohkubo, M. Furusaka, Y. Kiyanagi, K. Yamada, Kohei Morishita, K. Nakajima

Research output: Contribution to journalArticle

Abstract

Plastically deformed Ge-crystal wafers that have the cylindrical shape with a large curvature were characterized by neutron diffraction. The box-type rocking curve of Bragg reflection with the angular width of Γ box ≃ 2° in FWHM, which is observable in the monochromatic neutron diffraction, results in an enhancement in the angle-integrated intensity (Iθ). Besides, Iθ efficiently increases by stacking such Ge wafers. In the course of white neutron diffraction, the reflected-beam width near the focus point becomes sharper than the initial beam width. Further, the dependence of the horizontal beam width on the distance between the sample and detector is quantitatively explained by taking account of the large Γbox, the small mosaic spread of η ≃ 0:1°, and the thickness of the wafers. On the basis of these characterizations, use of plastically deformed Ge wafers as elements for high-luminance neutron monochromator is proposed.

Original languageEnglish
Pages (from-to)166-169
Number of pages4
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume693
DOIs
Publication statusPublished - Nov 21 2012
Externally publishedYes

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Monochromators
Neutron diffraction
monochromators
Neutrons
wafers
neutron diffraction
boxes
neutrons
Crystals
crystals
Full width at half maximum
Luminance
luminance
Detectors
curvature
augmentation
detectors
curves

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Instrumentation

Cite this

Plastically deformed Ge-crystal wafers as elements for neutron focusing monochromator. / Hiraka, H.; Ohkubo, K.; Furusaka, M.; Kiyanagi, Y.; Yamada, K.; Morishita, Kohei; Nakajima, K.

In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 693, 21.11.2012, p. 166-169.

Research output: Contribution to journalArticle

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AU - Hiraka, H.

AU - Ohkubo, K.

AU - Furusaka, M.

AU - Kiyanagi, Y.

AU - Yamada, K.

AU - Morishita, Kohei

AU - Nakajima, K.

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AB - Plastically deformed Ge-crystal wafers that have the cylindrical shape with a large curvature were characterized by neutron diffraction. The box-type rocking curve of Bragg reflection with the angular width of Γ box ≃ 2° in FWHM, which is observable in the monochromatic neutron diffraction, results in an enhancement in the angle-integrated intensity (Iθ). Besides, Iθ efficiently increases by stacking such Ge wafers. In the course of white neutron diffraction, the reflected-beam width near the focus point becomes sharper than the initial beam width. Further, the dependence of the horizontal beam width on the distance between the sample and detector is quantitatively explained by taking account of the large Γbox, the small mosaic spread of η ≃ 0:1°, and the thickness of the wafers. On the basis of these characterizations, use of plastically deformed Ge wafers as elements for high-luminance neutron monochromator is proposed.

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