Plastically deformed Si-crystal wafers for neutron-monochromator elements

H. Hiraka, K. Fujiwara, K. Yamada, K. Morishita, K. Nakajima

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Plastically deformed Si-crystal wafers were characterized by monochromatic neutron diffraction. During the cylindrically curved deformation, a resolution-limit Bragg peak changes into a box-type angular profile in accordance with the bulk curvature, associated with an enhancement in the angle-integrated intensity (Iθ). Stacking such wafers is efficient in amplifying Iθ further. We propose an application to neutron-focusing monochromator (or analyzer) crystals in order to design a quite compact spectrometer.

Original languageEnglish
Pages (from-to)137-140
Number of pages4
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume635
Issue number1
DOIs
Publication statusPublished - Apr 11 2011

Fingerprint

Monochromators
monochromators
Neutrons
wafers
neutrons
Crystals
Neutron diffraction
crystals
neutron diffraction
boxes
Spectrometers
analyzers
curvature
spectrometers
augmentation
profiles

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Instrumentation

Cite this

Plastically deformed Si-crystal wafers for neutron-monochromator elements. / Hiraka, H.; Fujiwara, K.; Yamada, K.; Morishita, K.; Nakajima, K.

In: Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 635, No. 1, 11.04.2011, p. 137-140.

Research output: Contribution to journalArticle

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