Point defect clusters and dislocations in FIB irradiated nanocrystalline aluminum films: An electron tomography and aberration-corrected high-resolution ADF-STEM study

Hosni Idrissi, Stuart Turner, Masatoshi Mitsuhara, Binjie Wang, Satoshi Hata, Michael Coulombier, Jean Pierre Raskin, Thomas Pardoen, Gustaaf Van Tendeloo, Dominique Schryvers

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31 Citations (Scopus)

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Engineering & Materials Science

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