Point-focusing monochromator crystal realized by hot plastic deformation of a Ge wafer

Hiroshi Okuda, Kazuo Nakajima, Kozo Fujiwara, Kohei Morishita, Shojiro Ochiai

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

Pre-polished Ge(111) single-crystal wafers were deformed just below the melting temperature to prepare point-focusing Johansson monochromator crystals. The (111) lattice plane had curvature 2R in the focusing plane and R perpendicular to it, with a hemispherical inner surface with a radius of R = 600 mm. By using Cu Kα radiation, the diverging X-ray beam was focused onto a small spot.

Original languageEnglish
Pages (from-to)798-799
Number of pages2
JournalJournal of Applied Crystallography
Volume41
Issue number4
DOIs
Publication statusPublished - Jul 24 2008

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Monochromators
monochromators
Crystal lattices
Freezing
Plastics
plastic deformation
Melting point
Plastic deformation
X-Rays
Single crystals
wafers
Radiation
X rays
Crystals
Temperature
crystals
curvature
melting
radii
single crystals

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Structural Biology

Cite this

Point-focusing monochromator crystal realized by hot plastic deformation of a Ge wafer. / Okuda, Hiroshi; Nakajima, Kazuo; Fujiwara, Kozo; Morishita, Kohei; Ochiai, Shojiro.

In: Journal of Applied Crystallography, Vol. 41, No. 4, 24.07.2008, p. 798-799.

Research output: Contribution to journalArticle

Okuda, Hiroshi ; Nakajima, Kazuo ; Fujiwara, Kozo ; Morishita, Kohei ; Ochiai, Shojiro. / Point-focusing monochromator crystal realized by hot plastic deformation of a Ge wafer. In: Journal of Applied Crystallography. 2008 ; Vol. 41, No. 4. pp. 798-799.
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