Polarity determination of wurtzite-type crystals using hard x-ray photoelectron diffraction

Jesse R. Williams, Masaaki Kobata, Igor Pis, Eiji Ikenaga, Takeharu Sugiyama, Keisuke Kobayashi, Naoki Ohashi

Research output: Contribution to journalArticle

18 Citations (Scopus)

Abstract

The surface structure of a single-crystal ZnO wafer was studied by angle-resolved x-ray photoelectron spectroscopy (ARXPS) using synchrotron radiation. As a result, well-defined x-ray photoelectron diffraction (XPD) patterns were obtained for the (0001) and (0001̄) polar surfaces using the photoemission from the Zn 2p3/2 and O 1s core levels. The XPD patterns were indexed assuming forward scattering of photoelectrons by neighboring ions. Further, the XPD patterns for the (0001) and (0001̄) surfaces were different from each other, indicating the possibility for using the XPD technique for polarity determination.

Original languageEnglish
Pages (from-to)1336-1340
Number of pages5
JournalSurface Science
Volume605
Issue number13-14
DOIs
Publication statusPublished - Jul 1 2011
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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    Williams, J. R., Kobata, M., Pis, I., Ikenaga, E., Sugiyama, T., Kobayashi, K., & Ohashi, N. (2011). Polarity determination of wurtzite-type crystals using hard x-ray photoelectron diffraction. Surface Science, 605(13-14), 1336-1340. https://doi.org/10.1016/j.susc.2011.04.036