Polarity determination of wurtzite-type crystals using hard x-ray photoelectron diffraction

Jesse R. Williams, Masaaki Kobata, Igor Pis, Eiji Ikenaga, Takeharu Sugiyama, Keisuke Kobayashi, Naoki Ohashi

Research output: Contribution to journalArticle

17 Citations (Scopus)

Abstract

The surface structure of a single-crystal ZnO wafer was studied by angle-resolved x-ray photoelectron spectroscopy (ARXPS) using synchrotron radiation. As a result, well-defined x-ray photoelectron diffraction (XPD) patterns were obtained for the (0001) and (0001̄) polar surfaces using the photoemission from the Zn 2p3/2 and O 1s core levels. The XPD patterns were indexed assuming forward scattering of photoelectrons by neighboring ions. Further, the XPD patterns for the (0001) and (0001̄) surfaces were different from each other, indicating the possibility for using the XPD technique for polarity determination.

Original languageEnglish
Pages (from-to)1336-1340
Number of pages5
JournalSurface Science
Volume605
Issue number13-14
DOIs
Publication statusPublished - Jul 1 2011
Externally publishedYes

Fingerprint

Photoelectrons
wurtzite
polarity
photoelectrons
Diffraction
X rays
Crystals
Diffraction patterns
diffraction
diffraction patterns
crystals
x rays
Forward scattering
Core levels
Photoemission
forward scattering
Photoelectron spectroscopy
Synchrotron radiation
Surface structure
x ray spectroscopy

All Science Journal Classification (ASJC) codes

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

Cite this

Williams, J. R., Kobata, M., Pis, I., Ikenaga, E., Sugiyama, T., Kobayashi, K., & Ohashi, N. (2011). Polarity determination of wurtzite-type crystals using hard x-ray photoelectron diffraction. Surface Science, 605(13-14), 1336-1340. https://doi.org/10.1016/j.susc.2011.04.036

Polarity determination of wurtzite-type crystals using hard x-ray photoelectron diffraction. / Williams, Jesse R.; Kobata, Masaaki; Pis, Igor; Ikenaga, Eiji; Sugiyama, Takeharu; Kobayashi, Keisuke; Ohashi, Naoki.

In: Surface Science, Vol. 605, No. 13-14, 01.07.2011, p. 1336-1340.

Research output: Contribution to journalArticle

Williams, JR, Kobata, M, Pis, I, Ikenaga, E, Sugiyama, T, Kobayashi, K & Ohashi, N 2011, 'Polarity determination of wurtzite-type crystals using hard x-ray photoelectron diffraction', Surface Science, vol. 605, no. 13-14, pp. 1336-1340. https://doi.org/10.1016/j.susc.2011.04.036
Williams, Jesse R. ; Kobata, Masaaki ; Pis, Igor ; Ikenaga, Eiji ; Sugiyama, Takeharu ; Kobayashi, Keisuke ; Ohashi, Naoki. / Polarity determination of wurtzite-type crystals using hard x-ray photoelectron diffraction. In: Surface Science. 2011 ; Vol. 605, No. 13-14. pp. 1336-1340.
@article{b7bb6378421542f2b38f0eacb1f7a1c1,
title = "Polarity determination of wurtzite-type crystals using hard x-ray photoelectron diffraction",
abstract = "The surface structure of a single-crystal ZnO wafer was studied by angle-resolved x-ray photoelectron spectroscopy (ARXPS) using synchrotron radiation. As a result, well-defined x-ray photoelectron diffraction (XPD) patterns were obtained for the (0001) and (0001̄) polar surfaces using the photoemission from the Zn 2p3/2 and O 1s core levels. The XPD patterns were indexed assuming forward scattering of photoelectrons by neighboring ions. Further, the XPD patterns for the (0001) and (0001̄) surfaces were different from each other, indicating the possibility for using the XPD technique for polarity determination.",
author = "Williams, {Jesse R.} and Masaaki Kobata and Igor Pis and Eiji Ikenaga and Takeharu Sugiyama and Keisuke Kobayashi and Naoki Ohashi",
year = "2011",
month = "7",
day = "1",
doi = "10.1016/j.susc.2011.04.036",
language = "English",
volume = "605",
pages = "1336--1340",
journal = "Surface Science",
issn = "0039-6028",
publisher = "Elsevier",
number = "13-14",

}

TY - JOUR

T1 - Polarity determination of wurtzite-type crystals using hard x-ray photoelectron diffraction

AU - Williams, Jesse R.

AU - Kobata, Masaaki

AU - Pis, Igor

AU - Ikenaga, Eiji

AU - Sugiyama, Takeharu

AU - Kobayashi, Keisuke

AU - Ohashi, Naoki

PY - 2011/7/1

Y1 - 2011/7/1

N2 - The surface structure of a single-crystal ZnO wafer was studied by angle-resolved x-ray photoelectron spectroscopy (ARXPS) using synchrotron radiation. As a result, well-defined x-ray photoelectron diffraction (XPD) patterns were obtained for the (0001) and (0001̄) polar surfaces using the photoemission from the Zn 2p3/2 and O 1s core levels. The XPD patterns were indexed assuming forward scattering of photoelectrons by neighboring ions. Further, the XPD patterns for the (0001) and (0001̄) surfaces were different from each other, indicating the possibility for using the XPD technique for polarity determination.

AB - The surface structure of a single-crystal ZnO wafer was studied by angle-resolved x-ray photoelectron spectroscopy (ARXPS) using synchrotron radiation. As a result, well-defined x-ray photoelectron diffraction (XPD) patterns were obtained for the (0001) and (0001̄) polar surfaces using the photoemission from the Zn 2p3/2 and O 1s core levels. The XPD patterns were indexed assuming forward scattering of photoelectrons by neighboring ions. Further, the XPD patterns for the (0001) and (0001̄) surfaces were different from each other, indicating the possibility for using the XPD technique for polarity determination.

UR - http://www.scopus.com/inward/record.url?scp=79957821397&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=79957821397&partnerID=8YFLogxK

U2 - 10.1016/j.susc.2011.04.036

DO - 10.1016/j.susc.2011.04.036

M3 - Article

AN - SCOPUS:79957821397

VL - 605

SP - 1336

EP - 1340

JO - Surface Science

JF - Surface Science

SN - 0039-6028

IS - 13-14

ER -