TY - JOUR
T1 - Polarization Image Sensor for Highly Sensitive Polarization Modulation Imaging Based on Stacked Polarizers
AU - Sasagawa, Kiyotaka
AU - Okada, Ryoma
AU - Haruta, Makito
AU - Takehara, Hironari
AU - Tashiro, Hiroyuki
AU - Ohta, Jun
N1 - Publisher Copyright:
© 1963-2012 IEEE.
PY - 2022/6/1
Y1 - 2022/6/1
N2 - In this article, We demonstrated an image sensor for detecting changes in polarization with high sensitivity. For this purpose, we constructed an optical system with a two-layer structure, comprising an external polarizer and polarizers on a pixel array. An external polarizer is used to enhance the polarization rotation while reducing the intensity to avoid pixel saturation of the image sensor. Using a two-layer structure, the two polarizers can be arranged under optimal conditions and the image sensor can achieve high polarization-change detection performance. We fabricated the polarization image sensor using a 0.35-μm CMOS process and, by averaging 50 ×, 50 pixels and 96 frames, achieved a polarization rotation detection limit of 5.2 ×, 10-4° at a wavelength of 625 nm. We also demonstrated the applicability of electric-field distribution imaging using an electrooptic crystal (ZnTe) for weak-polarization-change distribution measurements.
AB - In this article, We demonstrated an image sensor for detecting changes in polarization with high sensitivity. For this purpose, we constructed an optical system with a two-layer structure, comprising an external polarizer and polarizers on a pixel array. An external polarizer is used to enhance the polarization rotation while reducing the intensity to avoid pixel saturation of the image sensor. Using a two-layer structure, the two polarizers can be arranged under optimal conditions and the image sensor can achieve high polarization-change detection performance. We fabricated the polarization image sensor using a 0.35-μm CMOS process and, by averaging 50 ×, 50 pixels and 96 frames, achieved a polarization rotation detection limit of 5.2 ×, 10-4° at a wavelength of 625 nm. We also demonstrated the applicability of electric-field distribution imaging using an electrooptic crystal (ZnTe) for weak-polarization-change distribution measurements.
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U2 - 10.1109/TED.2022.3140288
DO - 10.1109/TED.2022.3140288
M3 - Article
AN - SCOPUS:85124107458
VL - 69
SP - 2924
EP - 2931
JO - IEEE Transactions on Electron Devices
JF - IEEE Transactions on Electron Devices
SN - 0018-9383
IS - 6
ER -