Polarized micro Raman scattering spectroscopy for curved edges of epitaxial graphene

Md Sherajul Islam, A. G. Bhuiyan, S. Tanaka, T. Makino, A. Hashimoto

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

This letter performed polarized microscopic laser Raman scattering spectroscopy on the curved edges of transferred epitaxial graphene on SiO2/Si. The intensity ratio between the parallel and perpendicular polarized D band is evolved, providing a spectroscopy-based technique to probe the atomic-scale edge structures in graphene. A detailed analysis procedure for non-ideal disordered curved edges of graphene is developed combining the atomic-scale zigzag and armchair edge structures along with some point defects. These results could provide valuable information of the realistic edges of graphene at the atomic-scale that can strongly influence the performance of graphene-based nanodevices.

Original languageEnglish
Article number243103
JournalApplied Physics Letters
Volume105
Issue number24
DOIs
Publication statusPublished - Dec 15 2014

Fingerprint

graphene
Raman spectra
spectroscopy
point defects
probes
lasers

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

Polarized micro Raman scattering spectroscopy for curved edges of epitaxial graphene. / Islam, Md Sherajul; Bhuiyan, A. G.; Tanaka, S.; Makino, T.; Hashimoto, A.

In: Applied Physics Letters, Vol. 105, No. 24, 243103, 15.12.2014.

Research output: Contribution to journalArticle

Islam, Md Sherajul ; Bhuiyan, A. G. ; Tanaka, S. ; Makino, T. ; Hashimoto, A. / Polarized micro Raman scattering spectroscopy for curved edges of epitaxial graphene. In: Applied Physics Letters. 2014 ; Vol. 105, No. 24.
@article{e07123e9a27544639e03e5dcdd2156fa,
title = "Polarized micro Raman scattering spectroscopy for curved edges of epitaxial graphene",
abstract = "This letter performed polarized microscopic laser Raman scattering spectroscopy on the curved edges of transferred epitaxial graphene on SiO2/Si. The intensity ratio between the parallel and perpendicular polarized D band is evolved, providing a spectroscopy-based technique to probe the atomic-scale edge structures in graphene. A detailed analysis procedure for non-ideal disordered curved edges of graphene is developed combining the atomic-scale zigzag and armchair edge structures along with some point defects. These results could provide valuable information of the realistic edges of graphene at the atomic-scale that can strongly influence the performance of graphene-based nanodevices.",
author = "Islam, {Md Sherajul} and Bhuiyan, {A. G.} and S. Tanaka and T. Makino and A. Hashimoto",
year = "2014",
month = "12",
day = "15",
doi = "10.1063/1.4904469",
language = "English",
volume = "105",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics Publising LLC",
number = "24",

}

TY - JOUR

T1 - Polarized micro Raman scattering spectroscopy for curved edges of epitaxial graphene

AU - Islam, Md Sherajul

AU - Bhuiyan, A. G.

AU - Tanaka, S.

AU - Makino, T.

AU - Hashimoto, A.

PY - 2014/12/15

Y1 - 2014/12/15

N2 - This letter performed polarized microscopic laser Raman scattering spectroscopy on the curved edges of transferred epitaxial graphene on SiO2/Si. The intensity ratio between the parallel and perpendicular polarized D band is evolved, providing a spectroscopy-based technique to probe the atomic-scale edge structures in graphene. A detailed analysis procedure for non-ideal disordered curved edges of graphene is developed combining the atomic-scale zigzag and armchair edge structures along with some point defects. These results could provide valuable information of the realistic edges of graphene at the atomic-scale that can strongly influence the performance of graphene-based nanodevices.

AB - This letter performed polarized microscopic laser Raman scattering spectroscopy on the curved edges of transferred epitaxial graphene on SiO2/Si. The intensity ratio between the parallel and perpendicular polarized D band is evolved, providing a spectroscopy-based technique to probe the atomic-scale edge structures in graphene. A detailed analysis procedure for non-ideal disordered curved edges of graphene is developed combining the atomic-scale zigzag and armchair edge structures along with some point defects. These results could provide valuable information of the realistic edges of graphene at the atomic-scale that can strongly influence the performance of graphene-based nanodevices.

UR - http://www.scopus.com/inward/record.url?scp=84919819896&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84919819896&partnerID=8YFLogxK

U2 - 10.1063/1.4904469

DO - 10.1063/1.4904469

M3 - Article

AN - SCOPUS:84919819896

VL - 105

JO - Applied Physics Letters

JF - Applied Physics Letters

SN - 0003-6951

IS - 24

M1 - 243103

ER -