Polarized micro Raman scattering spectroscopy for curved edges of epitaxial graphene

Md Sherajul Islam, A. G. Bhuiyan, S. Tanaka, T. Makino, A. Hashimoto

Research output: Contribution to journalArticlepeer-review

4 Citations (Scopus)


This letter performed polarized microscopic laser Raman scattering spectroscopy on the curved edges of transferred epitaxial graphene on SiO2/Si. The intensity ratio between the parallel and perpendicular polarized D band is evolved, providing a spectroscopy-based technique to probe the atomic-scale edge structures in graphene. A detailed analysis procedure for non-ideal disordered curved edges of graphene is developed combining the atomic-scale zigzag and armchair edge structures along with some point defects. These results could provide valuable information of the realistic edges of graphene at the atomic-scale that can strongly influence the performance of graphene-based nanodevices.

Original languageEnglish
Article number243103
JournalApplied Physics Letters
Issue number24
Publication statusPublished - Dec 15 2014

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)


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