Position sensitivity of a segmented planar Ge detector

E. Ideguchi, B. Cederwall, T. Bäck, L. Milechina, Y. Gono, Y. F. Yang, N. Aoi, T. Teranishi, D. Bucurescu, T. Kishida

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

A method to extract depth of interaction information for γ-rays in a segmented planar Ge detector is presented. The method is demonstrated on signals from a segmented detector which were stored by a digital oscilloscope event by event and analysed off-line. Event samples were acquired for different interaction points in the detector. A Compton scatter coincidence detection technique ensured that the event samples were highly enriched in single-interaction events. By analysing pulse shapes and the relative timing between anode pulses and the pulses from the irradiated cathode segment, a position sensitivity of 1-2 mm in the depth direction was deduced. A similar transverse position sensitivity was inferred by studying image charge pulses on neighbouring segments.

Original languageEnglish
Pages (from-to)373-384
Number of pages12
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume496
Issue number2-3
DOIs
Publication statusPublished - Jan 11 2003
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Nuclear and High Energy Physics
  • Instrumentation

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