Power-law scaling of proton conductivity in amorphous silicate thin films

Yoshitaka Aoki, Hiroki Habazaki, Toyoki Kunitake

Research output: Contribution to journalArticle

Abstract

Amorphous hafnium silicate, a-Hf0.1Si0.9O x, thin film with thickness of 32, 41, 55, 80, 110, 120, 180 and 320 nm was prepared by multiple spin-cast process and the proton conductivity across the films was measured at intermediate temperatures (100-400 °C) in dry atmosphere. The morphologically- and compositionally-uniform films were prepared on a substrate as confirmed by SEM, RBS and XPS measurements. a-Hf 0.1Si0.9Ox thin film clearly revealed the H/D isotope effect on ionic conductivity, indicating that protonic conduction is dominant in the measured temperature range. The films did not reveal thickness-dependent proton conductivity in dry air and the σ at given temperatures is almost constant at any thickness. No increment of σ in a-Hf0.1Si0.9Ox thin films by reduction of thickness might be related to the absence of the highly-conductive acid network with mesoscopically-sized length because of the relatively low concentration of Brønsted acid sites inside films.

Original languageEnglish
Pages (from-to)93-96
Number of pages4
JournalSolid State Ionics
Volume192
Issue number1
DOIs
Publication statusPublished - Jun 16 2011
Externally publishedYes

Fingerprint

Silicates
Proton conductivity
Scaling laws
scaling laws
silicates
Thin films
conductivity
protons
thin films
Hafnium
acids
Acids
hafnium
Ionic conductivity
Isotopes
isotope effect
Temperature
ion currents
temperature
casts

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Materials Science(all)
  • Condensed Matter Physics

Cite this

Power-law scaling of proton conductivity in amorphous silicate thin films. / Aoki, Yoshitaka; Habazaki, Hiroki; Kunitake, Toyoki.

In: Solid State Ionics, Vol. 192, No. 1, 16.06.2011, p. 93-96.

Research output: Contribution to journalArticle

Aoki, Yoshitaka ; Habazaki, Hiroki ; Kunitake, Toyoki. / Power-law scaling of proton conductivity in amorphous silicate thin films. In: Solid State Ionics. 2011 ; Vol. 192, No. 1. pp. 93-96.
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