Pplication of synchrotron-based reciprocal-space mapping at a fixed angular position to identification of crystal symmetry of Bi4Ti 3O12 epitaxial thin films

Osami Sakata, Takayuki Watanabe, Hiroshi Funakubo

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Abstract

The crystal structures of Bi4Ti3O12 epitaxial films with thicknesses of 50 and 3 nm were investigated using synchrotron-based diffraction. Films with (100)/(010) orientations (i.e. a and b domains) were grown on TiO2(101) single crystals using metal-organic chemical vapor deposition. Synchrotron-based reciprocal-space mapping at a fixed angular position was applied to the determination of the crystal symmetry of the films. This method used a grazing-incidence geometry at a fixed azimuthal angle using 25 keV incident X-rays, which enabled the generation of a reciprocal-space map with a single X-ray exposure. The maps recorded about 120 and 30 diffraction spots from the 50 and 3 nm-thick samples, respectively. A two-dimensional 200× 250 mm detector was used 133 mm downstream from the sample. The results revealed that both Bi4Ti3O 12 films had a B1a1 monoclinic structure or a lower crystal symmetry.

Original languageEnglish
Pages (from-to)385-391
Number of pages7
JournalJournal of Applied Crystallography
Volume44
Issue number2
DOIs
Publication statusPublished - Apr 1 2011
Externally publishedYes

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All Science Journal Classification (ASJC) codes

  • Biochemistry, Genetics and Molecular Biology(all)

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