Abstract
A new pattern projection technique for measuring 3D topography is presented, in order to shorten the measurement time and to improve measurement accuracy. The Monochrome-Projection Color-Analysis (MPCA) technique is proposed to measure an object with a complicated surface color distribution. An optimal color channel is chosen and a single channel image for intensity calculation is compounded so that the greatest amount of information from an observation pattern image is used. Moreover, in order to measure a greater number of stripes in a single projection, Optimal Intensity-Modulation Projection (OIMP) technology is adopted. By using of combination of MPCA and OIMP, about 100 stripes are reliably detectable in a single optimal pattern projection and double image capture.
| Original language | English |
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| Title of host publication | Proceedings of the Seventh IASTED International Conference on Computer Graphics and Imaging |
| Editors | M.H. Hamza |
| Pages | 254-259 |
| Number of pages | 6 |
| Publication status | Published - 2004 |
| Externally published | Yes |
| Event | Proceedings of the Seventh IASTED International Conference on Computer Graphics and Imaging - Kauai, HI, United States Duration: Aug 17 2004 → Aug 19 2004 |
Other
| Other | Proceedings of the Seventh IASTED International Conference on Computer Graphics and Imaging |
|---|---|
| Country/Territory | United States |
| City | Kauai, HI |
| Period | 8/17/04 → 8/19/04 |
All Science Journal Classification (ASJC) codes
- Engineering(all)