TY - GEN
T1 - Practical challenges in logic BIST Implementation - Case studies
AU - Wu, Shianling
AU - Furukawa, Hiroshi
AU - Sheu, Boryau
AU - Wang, Laung Terng
AU - Chao, Hao Jan
AU - Yu, Lizhen
AU - Wen, Xiaoqing
AU - Murakami, Michio
PY - 2008/12/1
Y1 - 2008/12/1
N2 - TurboBIST-Logic (TBL) is a software tool suite for incorporating logic built-in self-test (BIST) technology into digital Integrated Circuits and has been used by a variety of industrial designs globally since 2002. This abstract describes major features of TBL, and uses three industrial cases to show practical issues encountered and solved over the years. It also discusses an important new trend in going "hybrid," a flexible combination of capture-clocking schemes, with the goal to achieve an ever more optimal result over stand-alone schemes. Each of the three cases had its unique requirements for logic BIST, some needing to customize an existing solution, but all were set to achieve common BIST goals of at-speed testing, simple test interface to/from ATE, low test cost, high product reliability, and repeat testability investment reuse from IC, board, system, to in-field diagnosis.
AB - TurboBIST-Logic (TBL) is a software tool suite for incorporating logic built-in self-test (BIST) technology into digital Integrated Circuits and has been used by a variety of industrial designs globally since 2002. This abstract describes major features of TBL, and uses three industrial cases to show practical issues encountered and solved over the years. It also discusses an important new trend in going "hybrid," a flexible combination of capture-clocking schemes, with the goal to achieve an ever more optimal result over stand-alone schemes. Each of the three cases had its unique requirements for logic BIST, some needing to customize an existing solution, but all were set to achieve common BIST goals of at-speed testing, simple test interface to/from ATE, low test cost, high product reliability, and repeat testability investment reuse from IC, board, system, to in-field diagnosis.
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U2 - 10.1109/ATS.2008.59
DO - 10.1109/ATS.2008.59
M3 - Conference contribution
AN - SCOPUS:58249116005
SN - 9780769533964
T3 - Proceedings of the Asian Test Symposium
BT - Proceedings of the 17th Asian Test Symposium, ATS 2008
T2 - 17th Asian Test Symposium, ATS 2008
Y2 - 23 November 2008 through 26 November 2008
ER -