Abstract
TurboBIST-Logic (TBL) is a software tool suite for incorporating logic built-in self-test (BIST) technology into digital Integrated Circuits and has been used by a variety of industrial designs globally since 2002. This abstract describes major features of TBL, and uses three industrial cases to show practical issues encountered and solved over the years. It also discusses an important new trend in going "hybrid," a flexible combination of capture-clocking schemes, with the goal to achieve an ever more optimal result over stand-alone schemes. Each of the three cases had its unique requirements for logic BIST, some needing to customize an existing solution, but all were set to achieve common BIST goals of at-speed testing, simple test interface to/from ATE, low test cost, high product reliability, and repeat testability investment reuse from IC, board, system, to in-field diagnosis.
| Original language | English |
|---|---|
| Title of host publication | Proceedings of the 17th Asian Test Symposium, ATS 2008 |
| Number of pages | 1 |
| DOIs | |
| Publication status | Published - Dec 1 2008 |
| Event | 17th Asian Test Symposium, ATS 2008 - Sapporo, Japan Duration: Nov 24 2008 → Nov 27 2008 |
Publication series
| Name | Proceedings of the Asian Test Symposium |
|---|---|
| ISSN (Print) | 1081-7735 |
Other
| Other | 17th Asian Test Symposium, ATS 2008 |
|---|---|
| Country | Japan |
| City | Sapporo |
| Period | 11/24/08 → 11/27/08 |
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All Science Journal Classification (ASJC) codes
- Electrical and Electronic Engineering
Cite this
Practical challenges in logic BIST Implementation - Case studies. / Wu, Shianling; Furukawa, Hiroshi; Sheu, Boryau; Wang, Laung Terng; Chao, Hao Jan; Yu, Lizhen; Wen, Xiaoqing; Murakami, Michio.
Proceedings of the 17th Asian Test Symposium, ATS 2008. 2008. 4711596 (Proceedings of the Asian Test Symposium).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
}
TY - GEN
T1 - Practical challenges in logic BIST Implementation - Case studies
AU - Wu, Shianling
AU - Furukawa, Hiroshi
AU - Sheu, Boryau
AU - Wang, Laung Terng
AU - Chao, Hao Jan
AU - Yu, Lizhen
AU - Wen, Xiaoqing
AU - Murakami, Michio
PY - 2008/12/1
Y1 - 2008/12/1
N2 - TurboBIST-Logic (TBL) is a software tool suite for incorporating logic built-in self-test (BIST) technology into digital Integrated Circuits and has been used by a variety of industrial designs globally since 2002. This abstract describes major features of TBL, and uses three industrial cases to show practical issues encountered and solved over the years. It also discusses an important new trend in going "hybrid," a flexible combination of capture-clocking schemes, with the goal to achieve an ever more optimal result over stand-alone schemes. Each of the three cases had its unique requirements for logic BIST, some needing to customize an existing solution, but all were set to achieve common BIST goals of at-speed testing, simple test interface to/from ATE, low test cost, high product reliability, and repeat testability investment reuse from IC, board, system, to in-field diagnosis.
AB - TurboBIST-Logic (TBL) is a software tool suite for incorporating logic built-in self-test (BIST) technology into digital Integrated Circuits and has been used by a variety of industrial designs globally since 2002. This abstract describes major features of TBL, and uses three industrial cases to show practical issues encountered and solved over the years. It also discusses an important new trend in going "hybrid," a flexible combination of capture-clocking schemes, with the goal to achieve an ever more optimal result over stand-alone schemes. Each of the three cases had its unique requirements for logic BIST, some needing to customize an existing solution, but all were set to achieve common BIST goals of at-speed testing, simple test interface to/from ATE, low test cost, high product reliability, and repeat testability investment reuse from IC, board, system, to in-field diagnosis.
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UR - http://www.scopus.com/inward/citedby.url?scp=58249116005&partnerID=8YFLogxK
U2 - 10.1109/ATS.2008.59
DO - 10.1109/ATS.2008.59
M3 - Conference contribution
AN - SCOPUS:58249116005
SN - 9780769533964
T3 - Proceedings of the Asian Test Symposium
BT - Proceedings of the 17th Asian Test Symposium, ATS 2008
ER -