Preferential axis control of YBa2Cu3Ox thin film by quasilattice-match engineering

Masashi Mukaida, Shintaro Miyazawa

Research output: Contribution to journalArticle

25 Citations (Scopus)

Abstract

The lowest temperature for c-axis preferred oriented thin film growth is investigated for films on different substrate materials. This temperature has a maximum when the lattice constant of the substrate matches that of YBa 2Cu3Ox. This result readily explains a-axis preferred oriented film growth by the template technique. We propose quasilattice-match engineering as a technique for controlling the preferential orientation axis of a part of a YBa2Cu3Ox thin film by using a seed layer whose lattice mismatch differs from that of the substrate. The part of the YBa2Cu3Ox thin film on a PrGaO3 seed layer is a-axis oriented and the film directly deposited on a SrTiO3 substrate is c-axis oriented.

Original languageEnglish
Pages (from-to)1209-1212
Number of pages4
JournalJournal of Applied Physics
Volume74
Issue number2
DOIs
Publication statusPublished - 1993
Externally publishedYes

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engineering
thin films
seeds
templates
temperature

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Cite this

Preferential axis control of YBa2Cu3Ox thin film by quasilattice-match engineering. / Mukaida, Masashi; Miyazawa, Shintaro.

In: Journal of Applied Physics, Vol. 74, No. 2, 1993, p. 1209-1212.

Research output: Contribution to journalArticle

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