Abstract
Propagation loss of core-top etched Si/SiO2 waveguide was preliminarily evaluated for the first time. As a result, approximately 8 dB/cm increase has been confirmed after core-top etching.
| Original language | English |
|---|---|
| Title of host publication | MOC 2015 - Technical Digest of 20th Microoptics Conference |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| ISBN (Electronic) | 9784863485433 |
| DOIs | |
| Publication status | Published - Feb 23 2016 |
| Event | 20th Microoptics Conference, MOC 2015 - Fukuoka, Japan Duration: Oct 25 2015 → Oct 28 2015 |
Publication series
| Name | MOC 2015 - Technical Digest of 20th Microoptics Conference |
|---|
Other
| Other | 20th Microoptics Conference, MOC 2015 |
|---|---|
| Country | Japan |
| City | Fukuoka |
| Period | 10/25/15 → 10/28/15 |
All Science Journal Classification (ASJC) codes
- Atomic and Molecular Physics, and Optics
- Electronic, Optical and Magnetic Materials
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Cite this
Sakata, R., Tanabe, K., Tanaka, R., Jiang, H., & Hamamoto, K. (2016). Preliminarily propagation loss evaluation of core-top etched waveguide for step-core LP21 mode converter. In MOC 2015 - Technical Digest of 20th Microoptics Conference [7416460] (MOC 2015 - Technical Digest of 20th Microoptics Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MOC.2015.7416460