Preliminarily propagation loss evaluation of core-top etched waveguide for step-core LP21 mode converter

Ryosuke Sakata, Kazuhiro Tanabe, Ryo Tanaka, Haisong Jiang, Kiichi Hamamoto

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Propagation loss of core-top etched Si/SiO2 waveguide was preliminarily evaluated for the first time. As a result, approximately 8 dB/cm increase has been confirmed after core-top etching.

Original languageEnglish
Title of host publicationMOC 2015 - Technical Digest of 20th Microoptics Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9784863485433
DOIs
Publication statusPublished - Feb 23 2016
Event20th Microoptics Conference, MOC 2015 - Fukuoka, Japan
Duration: Oct 25 2015Oct 28 2015

Publication series

NameMOC 2015 - Technical Digest of 20th Microoptics Conference

Other

Other20th Microoptics Conference, MOC 2015
CountryJapan
CityFukuoka
Period10/25/1510/28/15

All Science Journal Classification (ASJC) codes

  • Atomic and Molecular Physics, and Optics
  • Electronic, Optical and Magnetic Materials

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    Sakata, R., Tanabe, K., Tanaka, R., Jiang, H., & Hamamoto, K. (2016). Preliminarily propagation loss evaluation of core-top etched waveguide for step-core LP21 mode converter. In MOC 2015 - Technical Digest of 20th Microoptics Conference [7416460] (MOC 2015 - Technical Digest of 20th Microoptics Conference). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/MOC.2015.7416460